In situ trap properties in CCDs: the donor level of the silicon divacancy

The silicon divacancy is one of the main defects of concern in radiation damage studies of Charge-Coupled Devices (CCDs) and, being immobile at room temperature, the defect is accessible to a variety of characterisation techniques. As such, there is a large amount of (often conflicting) information in the literature regarding this defect. Here we study the donor level of the divacancy, one of three energy levels which lie between the silicon valence and conduction bands. The donor level of the divacancy acts as a trap for holes in silicon and therefore can be studied through the use of a p-channel CCD. The method of trap-pumping, linked closely to the process of pocket-pumping, has been demonstrated in the literature over the last two years to allow for in-situ analysis of defects in the silicon of CCDs. However, most work so far has been a demonstartion [sic] of the techinique [sic]. We begin here to use the technique for detailed studies of a specific defect centre in silicon, the donor level of the divacancy. The trap density post-irradiation can be found, and each instance of the trap identified independently of all others. Through the study of the trap response at different clocking frequencies one can measure directly the defect emission time constant, and through tracking this at different temperatures, it is possible to use Shockley-Read-Hall theory to calculate the trap energy level and cross-section. A large population of traps, all with parameters consistent with the donor level of the divacancy, has been studied, leading to a measure of the distribution of properties. The emission time constant, energy level and cross-section are found to have relatively large spreads, significantly beyond the small uncertainty in the measurement technique. This spread has major implications on the correction of charge transfer inefficiency effects in space applications in which high precision is required

Proton irradiation of a swept charge device at cryogenic temperature and the subsequent annealing

A number of studies have demonstrated that a room temperature proton irradiation may not be sufficient to provide an accurate estimation of the impact of the space radiation environment on detector performance. This is a result of the relationship between defect mobility and temperature, causing the performance to vary subject to the temperature history of the device from the point at which it was irradiated. Results measured using Charge Coupled Devices (CCD) irradiated at room temperature therefore tend to differ from those taken when the device was irradiated at a cryogenic temperature, more appropriate considering the operating conditions in space, impacting the prediction of in-flight performance. This paper describes the cryogenic irradiation, and subsequent annealing of an e2v technologies Swept Charge Device (SCD) CCD236 irradiated at −35.4°C with a 10 MeV equivalent proton fluence of 5.0 × 108 protons centerdot cm−2. The CCD236 is a large area (4.4 cm2) X-ray detector that will be flown on-board the Chandrayaan-2 and Hard X-ray Modulation Telescope spacecraft, in the Chandrayaan-2 Large Area Soft X-ray Spectrometer and the Soft X-ray Detector respectively. The SCD is readout continually in order to benefit from intrinsic dither mode clocking, leading to suppression of the surface component of the dark current and allowing the detector to be operated at warmer temperatures than a conventional CCD. The SCD is therefore an excellent choice to test and demonstrate the variation in the impact of irradiation at cryogenic temperatures in comparison to a more typical room temperature irradiation

Charge transfer efficiency in a p-channel CCD irradiated cryogenically and the impact of room temperature annealing

It is important to understand the impact of the space radiation environment on detector performance, thereby ensuring that the optimal operating conditions are selected for use in flight. The best way to achieve this is by irradiating the device using appropriate mission operating conditions, i.e. holding the device at mission operating temperature with the device powered and clocking. This paper describes the Charge Transfer Efficiency (CTE) measurements made using an e2v technologies p-channel CCD204 irradiated using protons to the 10 MeV equivalent fluence of 1.24×109 protons.cm-2 at 153 K. The device was held at 153 K for a period of 7 days after the irradiation before being allowed up to room temperature where it was held at rest, i.e. unbiased, for twenty six hours to anneal before being cooled back to 153 K for further testing, this was followed by a further one week and three weeks of room temperature annealing each separated by further testing. A comparison to results from a previous room temperature irradiation of an n-channel CCD204 is made using assumptions of a factor of two worse CTE when irradiated under cryogenic conditions which indicate that p-channel CCDs offer improved tolerance to radiation damage when irradiated under cryogenic conditions

Trap pumping schemes for the Euclid CCD273 detector: characterisation of electrodes and defects

The VISible imager instrument (VIS) on board the Euclid mission will deliver high resolution shape measurements of galaxies down to very faint limits (R ~ 25 at 10σ) in a large part of the sky, in order to infer the distribution of dark matter in the Universe. To help mitigate radiation damage effects that will accumulate in the detectors over the mission lifetime, the properties of the radiation induced traps needs to be known with as high precision as possible. For this purpose the trap pumping method will be employed as part of the in-orbit calibration routines. Using trap pumping it is possible to identify and characterise single traps in a Charge-Coupled Device (CCD), thus providing information such as the density, emission time constants and sub-pixel positions of the traps in the detectors. This paper presents the trap pumping algorithms used for the radiation testing campaign of the CCD273 detectors, performed by the Centre for Electronic Imaging (CEI) at the Open University, that will be used for the VIS instrument. The CCD273 is a four-phase device with uneven phase widths, which complicates the trap pumping analysis. However, we find that by optimising the trap pumping algorithms and analysis routines, it is possible to obtain sub-pixel and even sub-phase positional information about the traps. Further, by comparing trap pumping data with simulations, it is possible to gain more information about the effective electrode widths of the device

Proton radiation damage assessment of a CCD for use in a Ultraviolet and Visible Spectrometer

This paper describes the radiation environment and radiation damage analysis performed for the Nadir and Occultation for MArs Discovery (NOMAD) Ultraviolet and Visible Spectrometer (UVIS) channel launched onboard the ExoMars Trace Gas Orbiter (TGO) in 2016. The aim of the instrument is to map the temporal and spatial variation of trace gases such as ozone and dust/cloud aerosols in the atmosphere of Mars. The instrument consists of a set of two miniature telescope viewing optics which allow for selective input onto the optical bench, where an e2v technologies CCD30-11 will be used as the detector. A Geometry Description Markup Language model of the spacecraft and instrument box was created and through the use of ESA's SPace ENVironment Information System (SPENVIS) an estimate of the 10 MeV equivalent proton fluence was made at a number of radiation sensitive regions within NOMAD, including that of the CCD30-11 which is the focus of this paper. The end of life 10 MeV equivalent proton fluence at the charge coupled device was estimated to be 4.7 × 109 protons.cm−2; three devices were irradiated at different levels up a 10 MeV equivalent fluence of 9.4 × 109 protons.cm−2. The dark current, charge transfer inefficiency, charge storage, and cosmetic quality of the devices was investigated pre- and post-irradiation, determining that the devices will continue to provide excellent science throughout the mission

Quantum efficiency measurements in the swept charge device CCD236

The e2v technologies plc. CCD236 is a Swept Charge Device (SCD) designed as a large area (20 mm × 20 mm) soft X-ray detector for spectroscopy in the range 0.8 keV to 10 keV. It benefits from improvements in design over the previous generation, the e2v CCD54, such as: a 4 times increased detector area, a reduction in split X-ray events due to the 100 μm × 100 μm `pixel' size, and improvements to radiation hardness. The CCD236 will be used in India's Chandrayaan-2 Large Soft X-ray Spectrometer (CLASS) instrument and China's Hard X-ray Modulation Telescope (HXMT). Measurements of the Quantum Efficiency (QE) have been obtained relative to a NIST calibrated photodiode over the energy range 0.2 keV to 1.9 keV, using the BESSY II X-ray synchrotron in Berlin. Two X-ray event counting methods are described and compared, and QE for soft X-ray interaction is reported. Uniformity of QE across the device is also investigated at energies between 0.52 keV and 1.5 keV in different areas of the detector. This work will enable the actual number of photons incident on the detectors to be calculated, thus ensuring that the CCD236 detectors provide valuable scientific data during use. By comparing the QE methods in this paper with the event processing techniques to be used with CLASS, an estimate of the instrument-specific QE for CLASS can be provided

Planetary X-ray fluorescence analogue laboratory experiments and an elemental abundance algorithm for C1XS

We have conducted laboratory experiments as an analogue to planetary XRF (X-ray fluorescence) missions in order to investigate the role of changing incidence (and phase) angle geometry and sample grain-size on the intensity of XRF from regolith-like samples. Our data provide evidence of a grain-size effect, where XRF line intensity decreases with increasing sample grain-size, as well as an almost ubiquitous increase in XRF line intensity above incidence angles of ~60°. Data from a lunar regolith simulant are also used to test the accuracy of an XRF abundance algorithm developed at the Rutherford Appleton Laboratory (RAL), which is used to estimate the major element abundance of the lunar surface from C1XS (Chandrayaan-1 X-ray Spectrometer) XRF data. In ideal situations (i.e., when the input spectrum is well defined and the XRF spectrum has a sufficient signal to noise ratio) the algorithm can recover a known rock composition to within 1.0 elemental wt. % (1 σ)

Euclid. II. The VIS Instrument

International audienceThis paper presents the specification, design, and development of the Visible Camera (VIS) on the ESA Euclid mission. VIS is a large optical-band imager with a field of view of 0.54 deg^2 sampled at 0.1" with an array of 609 Megapixels and spatial resolution of 0.18". It will be used to survey approximately 14,000 deg^2 of extragalactic sky to measure the distortion of galaxies in the redshift range z=0.1-1.5 resulting from weak gravitational lensing, one of the two principal cosmology probes of Euclid. With photometric redshifts, the distribution of dark matter can be mapped in three dimensions, and, from how this has changed with look-back time, the nature of dark energy and theories of gravity can be constrained. The entire VIS focal plane will be transmitted to provide the largest images of the Universe from space to date, reaching m_AB>24.5 with S/N >10 in a single broad I_E~(r+i+z) band over a six year survey. The particularly challenging aspects of the instrument are the control and calibration of observational biases, which lead to stringent performance requirements and calibration regimes. With its combination of spatial resolution, calibration knowledge, depth, and area covering most of the extra-Galactic sky, VIS will also provide a legacy data set for many other fields. This paper discusses the rationale behind the VIS concept and describes the instrument design and development before reporting the pre-launch performance derived from ground calibrations and brief results from the in-orbit commissioning. VIS should reach fainter than m_AB=25 with S/N>10 for galaxies of full-width half-maximum of 0.3" in a 1.3" diameter aperture over the Wide Survey, and m_AB>26.4 for a Deep Survey that will cover more than 50 deg^2. The paper also describes how VIS works with the other Euclid components of survey, telescope, and science data processing to extract the cosmological information