Analysis of the conduction mechanism through InSb quantum dot by tunnel CVC method

This work was supported by grants from the Russian Foundation for Basic Research Projects No. 16-07-00093 and No. 16-07-00185

Study of the surface microrelief of copper nanoparticles by the method of scanning probe microscopy

This work was supported by grants from the RFBR № 17-07-00407-а and № 17-32-50137-mol_nr

Effect of subphase conditions on the formation of graphene Langmuir monolayer

This work was supported by grant from DAAD 4.9977.2017/5.2

Investigation of the properties of quantum-dimensional semiconductor particles A3B5 by scanning probe microscopy, obtained by liquid chemical etching

The study was carried out with the financial support of the Russian Foundation for Basic Research in the framework of scientific projects 17-07-00407-а and 17-07-00139

Investigation of copper nanoparticles by the method of scanning probe microscopy

В данной работе получали мицеллярный раствор с НЧ меди, стабилизированными ПАВ анионного типа — додецилсульфатом натрия (ДДС) C12H25NaO4S в щелочной среде при pH ≈ 10, в качестве восстановителя использовали гидразин гидрат (ГГ) N2H4∙H2O. Спектрофотометрическое исследование полученного раствора на спектрофотометре SHIMADZU UV-2550 в диапазоне длин волн 190-900 нм показало наличие пика поглощения излучения при длине волны 580 нм, соответствующего НЧ меди.In this work a micellar solution was prepared with copper NPs stabilized by an anionic surfactant — sodium dodecyl sulfate (SDS) C12H25NaO4S at pH ≈ 10. Hydrazine hydrate (HH) N2H4∙H2O was used as the reducing agent. Spectrophotometric study of the obtained solution by means of SHIMADZU UV-2550 spectrophotometer in the wavelength range 190-900 nm is showed the presence of a radiation absorption peak at 580 nm corresponding of copper NPs. The study of images of copper NPs on the glass substrates with an ITO layer (Indium Tin Oxide) was carried out by scanning probe microscopy (SPM) in atomic-force microscopy (AFM) and scanning tunneling microscopy (STM) by means of NanoEducator. The AFM images were obtained and the current-voltage characteristics of the copper NPs were recorded (Fig. 1 (a) and (б), respectively).Работа выполнена при финансовой поддержке гранта Российского научного фонда (проект №14-12-00275) и Национального исследовательского Саратовского государственного университета