Multi-faceted microarchitecture level reliability characterization for NVIDIA and AMD GPUs

State-of-the-art GPU chips are designed to deliver extreme throughput for graphics as well as for data-parallel general purpose computing workloads (GPGPU computing). Unlike computing for graphics, GPGPU computing requires highly reliable operations. Since provisioning for high reliability may affect performance, the design of GPGPU systems requires the vulnerability of GPU workloads to soft-errors to be jointly evaluated with the performance of GPU chips. We present an extended study based on a consolidated workflow for the evaluation of the reliability in correlation with the performance of four GPU architectures and corresponding chips: AMD Southern Islands and NVIDIA G80/GT200/Fermi. We obtained reliability measurements (AVF and FIT) employing both fault injection and ACE-analysis based on microarchitecture-level simulators. Apart from the reliability-only and performance-only measurements, we propose combined metrics for performance and reliability that assist comparisons for the same application among GPU chips of different ISAs and vendors, as well as among benchmarks on the same GPU chip

Microarchitecture level reliability comparison of modern GPU designs: First findings

State-of-the-art GPU chips are designed to deliver extreme throughput for graphics as well as for data-parallel general purpose computing workloads (GPGPU computing). Unlike graphics computing, GPGPU computing requires highly reliable operation. The performance-oriented design of GPUs requires to jointly evaluate the vulnerability of GPU workloads to soft-errors with the performance of GPU chips. We briefly present a summary of the findings of an extensive study aiming at the evaluation of the reliability of four GPU architectures and corresponding chips, orrelating them with the performance of the workloads

MeRLiN: Exploiting dynamic instruction behavior for fast and accurate microarchitecture level reliability assessment

Early reliability assessment of hardware structures using microarchitecture level simulators can effectively guide major error protection decisions in microprocessor design. Statistical fault injection on microarchitectural structures modeled in performance simulators is an accurate method to measure their Architectural Vulnerability Factor (AVF) but requires excessively long campaigns to obtain high statistical significance. We propose MeRLiN1, a methodology to boost microarchitecture level injection-based reliability assessment by several orders of magnitude and keep the accuracy of the assessment unaffected even for large injection campaigns with very high statistical significance. The core of MeRLiN is the grouping of faults of an initial list in equivalent classes. All faults in the same group target equivalent vulnerable intervals of program execution ending up to the same static instruction that reads the faulty entries. Faults in the same group occur in different times and entries of a structure and it is extremely likely that they all have the same effect in program execution; thus, fault injection is performed only on a few representatives from each group. We evaluate MeRLiN for different sizes of the physical register file, the store queue and the first level data cache of a contemporary microarchitecture running MiBench and SPEC CPU2006 benchmarks. For all our experiments, MeRLiN is from 2 to 3 orders of magnitude faster than an extremely high statistical significant injection campaign, reporting the same reliability measurements with negligible loss of accuracy. Finally, we theoretically analyze MeRLiN's statistical behavior to further justify its accuracy.Peer ReviewedPostprint (author's final draft

Exceeding Conservative Limits: A Consolidated Analysis on Modern Hardware Margins

Modern large-scale computing systems (data centers, supercomputers, cloud and edge setups and high-end cyber-physical systems) employ heterogeneous architectures that consist of multicore CPUs, general-purpose many-core GPUs, and programmable FPGAs. The effective utilization of these architectures poses several challenges, among which a primary one is power consumption. Voltage reduction is one of the most efficient methods to reduce power consumption of a chip. With the galloping adoption of hardware accelerators (i.e., GPUs and FPGAs) in large datacenters and other large-scale computing infrastructures, a comprehensive evaluation of the safe voltage reduction levels for each different chip can be employed for efficient reduction of the total power. We present a survey of recent studies in voltage margins reduction at the system level for modern CPUs, GPUs and FPGAs. The pessimistic voltage guardbands inserted by the silicon vendors can be exploited in all devices for significant power savings. On average, voltage reduction can reach 12% in multicore CPUs, 20% in manycore GPUs and 39% in FPGAs.Comment: Accepted for publication in IEEE Transactions on Device and Materials Reliabilit

Towards resilient EU HPC systems: A blueprint

This document aims to spearhead a Europe-wide discussion on HPC system resilience and to help the European HPC community define best practices for resilience. We analyse a wide range of state-of-the-art resilience mechanisms and recommend the most effective approaches to employ in large-scale HPC systems. Our guidelines will be useful in the allocation of available resources, as well as guiding researchers and research funding towards the enhancement of resilience approaches with the highest priority and utility. Although our work is focused on the needs of next generation HPC systems in Europe, the principles and evaluations are applicable globally.This work has received funding from the European Union’s Horizon 2020 research and innovation programme under the projects ECOSCALE (grant agreement No 671632), EPI (grant agreement No 826647), EuroEXA (grant agreement No 754337), Eurolab4HPC (grant agreement No 800962), EVOLVE (grant agreement No 825061), EXA2PRO (grant agreement No 801015), ExaNest (grant agreement No 671553), ExaNoDe (grant agreement No 671578), EXDCI-2 (grant agreement No 800957), LEGaTO (grant agreement No 780681), MB2020 (grant agreement No 779877), RECIPE (grant agreement No 801137) and SDK4ED (grant agreement No 780572). The work was also supported by the European Commission’s Seventh Framework Programme under the projects CLERECO (grant agreement No 611404), the NCSA-Inria-ANL-BSC-JSCRiken-UTK Joint-Laboratory for Extreme Scale Computing – JLESC (https://jlesc.github.io/), OMPI-X project (No ECP-2.3.1.17) and the Spanish Government through Severo Ochoa programme (SEV-2015-0493). This work was sponsored in part by the U.S. Department of Energy's Office of Advanced Scientific Computing Research, program managers Robinson Pino and Lucy Nowell. This manuscript has been authored by UT-Battelle, LLC under Contract No DE-AC05-00OR22725 with the U.S. Department of Energy.Preprin

SyRA: early system reliability analysis for cross-layer soft errors resilience in memory arrays of microprocessor systems

© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.Cross-layer reliability is becoming the preferred solution when reliability is a concern in the design of a microprocessor-based system. Nevertheless, deciding how to distribute the error management across the different layers of the system is a very complex task that requires the support of dedicated frameworks for cross-layer reliability analysis. This paper proposes SyRA, a system-level cross-layer early reliability analysis framework for radiation induced soft errors in memory arrays of microprocessor-based systems. The framework exploits a multi-level hybrid Bayesian model to describe the target system and takes advantage of Bayesian inference to estimate different reliability metrics. SyRA implements several mechanisms and features to deal with the complexity of realistic models and implements a complete tool-chain that scales efficiently with the complexity of the system. The simulation time is significantly lower than micro-architecture level or RTL fault-injection experiments with an accuracy high enough to take effective design decisions. To demonstrate the capability of SyRA, we analyzed the reliability of a set of microprocessor-based systems characterized by different microprocessor architectures (i.e., Intel x86, ARM Cortex-A15, ARM Cortex-A9) running both the Linux operating system or bare metal. Each system under analysis executes different software workloads both from benchmark suites and from real applications.Peer ReviewedPostprint (author's final draft