Reversible circuits with testability using quantum controlled NOT and swap gates

A new method of designing reversible circuits with inbuilt testability is presented by exploiting the properties of quantum controlled NOT and Swap gates. The design process is based on the methodology of placement of gates in such a manner that it produces parity preserving circuits. The testability of these circuits can be achieved by comparing the input and output parity under single bit fault detection. Experiments are conducted on a set of benchmark circuits which show an average reduction up to 51% in operating costs, when compared to existing work

Advances in genetics and molecular breeding of three legume crops of semi-arid tropics using next-generation sequencing and high-throughput genotyping technologies

Molecular markers are the most powerful genomic tools to increase the efficiency and precision of breeding practices for crop improvement. Progress in the development of genomic resources in the leading legume crops of the semi-arid tropics (SAT), namely, chickpea (Cicer arietinum), pigeonpea (Cajanus cajan) and groundnut (Arachis hypogaea), as compared to other crop species like cereals, has been very slow. With the advances in next-generation sequencing (NGS) and high-throughput (HTP) genotyping methods, there is a shift in development of genomic resources including molecular markers in these crops. For instance, 2,000 to 3,000 novel simple sequence repeats (SSR) markers have been developed each for chickpea, pigeonpea and groundnut. Based on Sanger, 454/FLX and Illumina transcript reads, transcriptome assemblies have been developed for chickpea (44,845 transcript assembly contigs, or TACs) and pigeonpea (21,434 TACs). Illumina sequencing of some parental genotypes of mapping populations has resulted in the development of 120 million reads for chickpea and 128.9 million reads for pigeonpea. Alignment of these Illumina reads with respective transcriptome assemblies have provided >10,000 SNPs each in chickpea and pigeonpea. A variety of SNP genotyping platforms including GoldenGate, VeraCode and Competitive Allele Specific PCR (KASPar) assays have been developed in chickpea and pigeonpea. By using above resources, the first-generation or comprehensive genetic maps have been developed in the three legume speciesmentioned above. Analysis of phenotyping data together with genotyping data has provided candidate markers for drought-tolerance-related root traits in chickpea, resistance to foliar diseases in groundnut and sterility mosaic disease (SMD) and fertility restoration in pigeonpea. Together with these traitassociated markers along with those already available, molecular breeding programmes have been initiated for enhancing drought tolerance, resistance to fusarium wilt and ascochyta blight in chickpea and resistance to foliar diseases in groundnut. These trait-associated robust markers along with other genomic resources including genetic maps and genomic resources will certainly accelerate crop improvement programmes in the SAT legum

Reversible circuits with testability using quantum controlled NOT and swap gates

529-532A new method of designing reversible circuits with inbuilt testability is presented by exploiting the properties of quantum controlled NOT and Swap gates. The design process is based on the methodology of placement of gates in such a manner that it produces parity preserving circuits. The testability of these circuits can be achieved by comparing the input and output parity under single bit fault detection. Experiments are conducted on a set of benchmark circuits which show an average reduction up to 51% in operating costs, when compared to existing work

Design for Stuck-at Fault Testability in MCT based Reversible Circuits

Testability leads to a large increment in operating costs from their original circuits which drastically increases the power consumption in logic circuits. This paper presents a new design for testability methodology for the detection of stuck-at faults in multiple controlled Toffoli based reversible circuits. The circuit is modified in such a manner that the applied test vector reaches all the levels without any change in values on the wires of the circuit. An (n+1) dimensional general test set containing only two test vectors is presented, which provide full coverage of single and multiple stuck-at faults in the circuit. The work is further extended to locate the occurrence of stuck-at faults in the circuit. Deterministic approaches are described and the modification methodology is experimented on a set of benchmarks. The present work achieved a reduction up to $50.58\%$ in operating costs as compared to the existing work implemented on the same platform

DATICS-2010: Welcome message from workshop organizers: FutureTech 2010

link_to_subscribed_fulltex