16 research outputs found

    Funktionell-ästhetische Nasenrekonstruktion bei Morbus Wegener und Lupus Erythematodes

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    DVT-Röntgen in der Routine einer HNO-Klinik

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    Die Technik der Repositionierung der lateralen Flügelknorpel zur Korrektur der Nasenspitze

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    Sequential fixed-width confidence bands for distribution functions under random censoring

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    Censored data, Kaplan-Meier estimate, fixed-width confidence band, sequential estimation,

    Sensitivity analysis for the reduction of complex metabolism models

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    Two different model reduction strategies are studied in order to test their applicability to reduce complex metabolism models. Using a model of one pre-identified model set describing complex metabolic dynamics after glucose pulse stimulation, a model reduction method based on the parameter tuning importance is compared with a pea based approach. Up to 49 of 122 parameters are rejected without significant changes of the simulated trajectories and of the flux distribution.Applying the reduction procedure to 12 other dynamic models reveals a general model structure inconsistency within the description of the pentose phosphate pathway. That points out the need of additional experiments to reproduce metabolite courses especially of this metabolic pathway.Thus the sensitivity based model reduction procedure is qualified as a promising tool for the model structure check and can be very useful for the entire model validation process which also includes the critical analysis of the data sets underlying the models. (C) 2004 Elsevier Ltd. All rights reserved

    Optimaler Entlassungstag nach einer Septorhinoplastik aus der Patientenperspektive

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    Probability and frequency of damage of electrical and electronic systems due to indirect lightning flashes

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    In the present paper data collected from the field related to the damage statistics of electrical and electronic systems due to lightning overvoltages are reported. These damages were registered by German insurance companies in 2005 and 2006 in different structures and installations. With the use of stochastical methods it is possible to reassess the collected data and to define cases, which are with high probability caused by lightning overvoltages. The results of the stochastic model are compared with the probability of damage distributions obtained by using the analytical method, which is the basis for the EEC Standard rules
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