Sub-Micron CMOS Characterisation for Single Chip Wireless Applications

This paper describes a multifunctional, electronically reconfigurable, small/large signal load pull measurement system and its integrated use with BSIM 3v3 for modelling of sub-micron CMOS transistors and sub-circuits. This turnkey measurement system can be electronically configured from a battery of instruments in order to characterise minimum noise, optimum power, intermodulation, dc and S-parameters, together with harmonic response and dynamic load line information under both source and load pull conditions. The instrumentation provides validation data against the BSIM physical model simulator. Hence, for the first time measurement of all of the significant devices parameters can be made for the device operated under all possible primary modes for model validation so that optimal circuit design can be carried out in a holistic fashion

A new technique for noise figure measurements of millimetre-wave mixers

A novel noise measurement method for mixers which exploits mixer noise figure variation with LO power is reported. The method allows for the first time high noise figures, e.g. at the maximum conversion gain point of millimetre wave mixers, to be found. With the technique proposed, noise figures as high as 20 dB can be accurately measured. The suggested method and its advantage over the conventional hot/cold noise measurement are demonstrated for a 65 GHz millimetre-wave GaAs MMIC down converter. For the mixer under test, the measured noise figures obtained were 9.3 dB with 7 dBm LO power and 15.1 dB with 13 dBm LO power, and the respective conversion gains were –1 dB (low noise point) and +3 dB (maximum conversion gain point)

Computer-aided Baritt microstrip oscillator design

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