289 research outputs found

    Nucleation and growth of precipitates in demixing glass melts in the system NA2O-CAO-SIO2.

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    As an example of a first order phase transition with conserved order parameter the demixing of glass-forming quasibinary systems has been investigated by in situ measurement of light scattering during heat treatment. The relative supercooling is consistent with theoretical expectations. Using a two stage heat treatment, nucleation and growth are decoupled. Nuclei formed at a nucleation temperature Tn can grow to sizes detectable by light scattering at a higher temperature Tgr, where no more nuclei are formed. Reducing the nucleation time, one at last ends up with an incubation time, the temperature dependence of which is described by an Arrhenius ansatz. For low particle densities, the growth mechanism can be deduced from the initial increase of the scattering intensity. The proportionality of the latter to t5 is characteristic for diffusion controlled growth of spheres in a depleted zone. From extrema in the scattering a definite size is assigned to the aggregate. Then, the number of particles can be deduced from the absolute intensity. For the systems investigated, however, growth time is limited by the occurrence of crystallisation, thus allowing only the determination of relative nucleation rates

    Comparative Atomic Force and Scanning Electron Microscopic Studies Disclosing Nanocrystallinity in Cordierite Glass-Ceramics : examples of Surface Modification

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    The atomic force microscopy (AFM), because of its unique features, can be used for a variety of applications and provides excellent research and development opportunities in the area of nanoscience and nanotechnology of glass and glass-ceramics. In this study, microscopic experiments have been carried out using both AFM and SEM on polished and etched as well as fracture cordierite glass-ceramic surfaces to unfold their comparative capabilities. Most importantly, it has been exhibited that the AFM is capable to ascertain single tiny crystallites originated at the beginning of crystallization of glasses before scanning electron microscope (SEM) or X-ray diffraction (XRD) detects them. AFM provides extraordinary two-dimensional (2D), three-dimensional (3D), and quick surface plot (QSP) formats of images with unobscured (since no coating is necessary) views of nanostructures rather than obscured (since conducting coating is essential for insulators such as glass and glass-ceramics) and only 2D microstructural profiles of SEM. Development of interatomic forces (extended up to tens to hundreds of angstorms from the sample surface) between the atoms of the very sharp tip (probe) and those of surface (sample) during measurement results in unprecedented resolution (similar to0.1 nm) of images in AFM. While SEM produces images (resolution similar to10 nm) based on secondary electron emission from the sample surface. By comparing the results with those of SEM experiments, the AFM is established as a simple and powerful technique for the characterization of nanostructures of glass-ceramics particularly of early stages of crystallization
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