119 research outputs found
Nonresonant microwave absorption in epitaxial La-Sr-Mn-O films and its relation to colossal magnetoresistance
We study magnetic-field-dependent nonresonant microwave absorption and
dispersion in thin LaSrMnO films and show that it
originates from the colossal magnetoresistance. We develop the model for
magnetoresistance of a thin ferromagnetic film in oblique magnetic field. The
model accounts fairly well for our experimental findings, as well as for
results of other researchers. We demonstrate that nonresonant microwave
absorption is a powerful technique that allows contactless measurement of
magnetic properties of thin films, including magnetoresistance, anisotropy
field and coercive field.Comment: 20 pages, 11 figure
Strain and correlation of self-organized Ge_(1-x)Mn_x nanocolumns embedded in Ge (001)
We report on the structural properties of Ge_(1-x)Mn_x layers grown by
molecular beam epitaxy. In these layers, nanocolumns with a high Mn content are
embedded in an almost-pure Ge matrix. We have used grazing-incidence X-ray
scattering, atomic force and transmission electron microscopy to study the
structural properties of the columns. We demonstrate how the elastic
deformation of the matrix (as calculated using atomistic simulations) around
the columns, as well as the average inter-column distance can account for the
shape of the diffusion around Bragg peaks.Comment: 9 pages, 7 figure
Local anisotropy in strained manganite thin films
We report on an angular resolved x-ray absorption spectroscopy study of the local atomic structure around the manganese ions in La0.7Sr0.3MnO3 thin films epitaxially grown on tensile and compressive substrates. Ab initio calculations provide strong support to the analysis of the experimental data and make possible the unambiguous derivation of a model of local distortion around the manganese atoms, without modification of the tilt angle Mn-O-Mn, among the octahedra. This distortion, tending to localize the charge carriers, is the driving parameter in the modifications of the magnetic and transport properties observed in thin films with respect to bulk systems. (C) 2003 American Institute of Physics.83173587358
Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging
Coherent diffraction imaging (CDI) on Bragg reflections is a promising
technique for the study of three-dimensional (3D) composition and strain fields
in nanostructures, which can be recovered directly from the coherent
diffraction data recorded on single objects. In this article we report results
obtained for single homogeneous and heterogeneous nanowires with a diameter
smaller than 100 nm, for which we used CDI to retrieve information about
deformation and faults existing in these wires. The article also discusses the
influence of stacking faults, which can create artefacts during the
reconstruction of the nanowire shape and deformation.Comment: 18 pages, 6 figures Submitted to New Journal of Physic
Anisotropic Magnetoresistance Effects in Fe, Co, Ni, Fe_4N, and Half-Metallic Ferromagnet: A Systematic Analysis
We theoretically analyze the anisotropic magnetoresistance (AMR) effects of
bcc Fe (+), fcc Co (+), fcc Ni (+), FeN (-), and a half-metallic
ferromagnet (-). The sign in each ( ) represents the sign of the AMR ratio
observed experimentally. We here use the two-current model for a system
consisting of a spin-polarized conduction state and localized d states with
spin--orbit interaction. From the model, we first derive a general expression
of the AMR ratio. The expression consists of a resistivity of the conduction
state of the spin ( or ), , and resistivities due to s--d scattering processes from the
conduction state to the localized d states. On the basis of this expression, we
next find a relation between the sign of the AMR ratio and the s--d scattering
process. In addition, we obtain expressions of the AMR ratios appropriate to
the respective materials. Using the expressions, we evaluate their AMR ratios,
where the expressions take into account the values of of the respective materials. The evaluated AMR
ratios correspond well to the experimental results.Comment: 17 pages, 12 figures, to be published in J. Phys. Soc. Jpn, minor
mistakes corrected, final versio
Local structure in strained manganite thin films
We report on a polarized X-ray absorption spectroscopy study, combining experimental measurements and ab initio calculations, of La0.7Sr0.3MnO3 films, epitaxially grown on tensile and compressive substrates. Measurements show significant modi. cations in the coordination shell around manganese atoms in the film plane for both substrates. We show that biaxial strain is locally accommodated in the coordination shell, by distortion of the MnO6 octahedron, without change in the tilt angle. The modi. cations of the near edge spectra were correlated to modi. cation in the average Mn-O bond distance and distortion of the MnO6 octahedra. This distortion tending to localize the charge carriers may account for the decrease of the Curie temperature observed in thin films with respect to bulk systems.T11558959
- …