36 research outputs found

    Gradually layered alternated substrate synthesis

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    Phase properties of high-reflectance two-material periodic mirrors: application to oblique-incidence tunable filters

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    International audienceMathematical expressions are developed for the phase-shift derivative with respect to the wavelength, in the case of nonquarter-wave, two-material, high-reflectance, periodic mirrors. These expressions are applied to the case of oblique incidence, and a condition relating the layer indices, which provides identical phase dispersion curves for both the P and S polarizations, is derived. The use of such mirrors in Fabry-Perot filters results in a common peak wavelength for both polarizations when the filter is used at oblique incidence, instead of the two separate spectral peaks usually observed. This property, which is illustrated by several numerical examples, is of great interest for the design of tunable filters, in which the angle of incidence is frequently used as a tuning parameter

    Athermal compensation of the stress-induced surface deflection of optical coatings using iso-admittance layers

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    International audienceMechanical stress in optical thin films can induce surface deflection of optical coatings. In the case of a substrate coated on both sides, a method is proposed which can provide perfect cancellation of this deflection, independently of the deposition process or any other external parameter, such as the temperature sensitivity of the mechanical stress. It is straightforward to implement this method, based on iso-admittance layers, since the thickness of such layers can be used to freely compensate for deflection effects only, without having any influence on the film's optical properties. This method is illustrated by two possible solutions for the design problem B from the Optical Interference Coatings (OIC) 2013 meeting

    Thin film approach for pi achromatic phase shifters

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    Metal-dielectric light absorbers manufactured by ion plating

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    Index determination for metallic thin films

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    Dedicated spectrophotometer for localized transmittance and reflectance measurements

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    Design of integrated optics filters

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