High pressure study of a Zr-based bulk metallic glass and its composite

Energy dispersive X-ray diffraction was used to study the structural evolution of a bulk metallic glass (BMG) alloy and its composite with W particles under hydrostatic pressure. The diffraction data, especially the pair distribution function (PDF) of the BMG allowed the direct measurement of its elastic strain. The results suggest that PDF patterns of BMGs can be used to deducetheir strain evolution in composites as well as in monolithic form. Although the PDF method of strain measurement in amorphous alloys offers lower resolution compared to the analysis of Bragg reflections from crystalline materials, the PDF techique yields valuable information about the deformation of BMGs

A Comparison of X-Ray Microdiffraction and Coherent Gradient Sensing in Measuring Discontinuous Curvatures in Thin Film: Substrate Systems

The coherent gradient sensor (CGS) is a shearing interferometer which has been proposed for the rapid, full-field measurement of deformation states (slopes and curvatures) in thin film-wafer substrate systems, and for the subsequent inference of stresses in the thin films. This approach needs to be verified using a more well-established but time-consuming grain orientation and stress measurement tool, X-ray microdiffraction (XRD). Both CGS and XRD are used to measure the deformation state of the same W film/Si wafer at room temperature. CGS provides a global, wafer-level measurement of slopes while XRD provides a local micromeasurement of lattice rotations. An extreme case of a circular Si wafer with a circular W film island in its center is used because of the presence of discontinuous system curvatures across the wafer. The results are also compared with a theoretical model based on elastic plate analysis of the axisymmetric biomaterial film-substrate system. Slope and curvature measurements by XRD and by CGS compare very well with each other and with theory. The favorable comparison demonstrates that wafer-level CGS metrology provides a quick and accurate alternative to other measurements. It also demonstrates the accuracy of plate theory in modeling thin film-substrate systems, even in the presence of curvature discontinuities

High pressure study of a Zr-based bulk metallic glass and its composite

Energy dispersive X-ray diffraction was used to study the structural evolution of a bulk metallic glass (BMG) alloy and its composite with W particles under hydrostatic pressure. The diffraction data, especially the pair distribution function (PDF) of the BMG allowed the direct measurement of its elastic strain. The results suggest that PDF patterns of BMGs can be used to deducetheir strain evolution in composites as well as in monolithic form. Although the PDF method of strain measurement in amorphous alloys offers lower resolution compared to the analysis of Bragg reflections from crystalline materials, the PDF techique yields valuable information about the deformation of BMGs

Synchrotron X-ray Diffraction Measurement of Reinforcement Strains in Uniaxially Stressed Bulk Metallic Glass Composites

High-energy synchrotron x-rays were used to measure internal reinforcement strains in bulk metallic glass composites containing tungsten or tantalum particles during in-situ uniaxial tensile loading. Load transfer from the matrix to the stiffer but weaker particles was characterized in both their elastic and plastic regimes and compared to theoretical predictions

Direct measurement of triaxial strain fields around ferroelectric domains using X-ray microdiffraction

Ferroelectric materials, such as BaTiO_3, have piezoelectric properties that make them attractive for microelectronic and sensing applications. It is well known that the application of mechanical stress or electric field can alter the domain structure in ferroelectrics. Indeed, the constitutive behaviour of a ferroelectric is largely governed by the formation, movement and interaction of its domains. Therefore, it is crucial that the micromechanics of domains and their effect on internal stresses in ferroelectrics be understood. Here we show that the emerging technique of scanning X-ray microdiffraction can be used to measure directly, for the first time, the local triaxial strain fields around 90° domains in single-crystal BaTiO_3. Specifically, residual strain maps in a region surrounding an isolated, approximately 40 µm wide, 90° domain were obtained with 3 µm resolution, revealing significant residual strains. This information is critical for accurate micromechanical modelling of domain behaviour in ferroelectrics

Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. Part II: Experimental validation of the non-local stress/curvature relations

The classical Stoney formula relating local equibiaxial film stress to local equibiaxial substrate curvature is not well equipped to handle realistic cases where the film misfit strain, the plate system curvature, and the film thickness and resulting film stress vary with in-plane position. In Part I of this work we have extended the Stoney formula to cover arbitrarily non-uniform film thickness for a thin film/substrate system subject to non-uniform, isotropic misfit strains. The film stresses are found to depend non-locally on system curvatures. In Part II we have designed a demanding experiment whose purpose is to validate the new analysis for the case of radially symmetric deformations. To achieve this, a circular film island with sharp edges and a radially variable, but known, thickness is deposited on the wafer center. The plate system’s curvatures and the film stress distribution are independently measured by using white beam and monochromatic X-ray microdiffraction (μXRD) measurements, respectively. The measured stress field (from monochromatic μXRD) is compared to the predictions of various stress/curvature analyses, all of which have the white beam μXRD measurements as input. The results reveal the shortcomings of the “local” Stoney approach and validate the accuracy of the new “non-local” relation, most notably near the film island edges where stress concentrations dominate