Preliminary results on the Multipactor effect prediction in RF components with ferrites

This paper deals with the analysis of the Multipactor effect in RF components with ferrites performed through the preliminary measurements of ferrites secondary emission coefficient and the simulations of the effect of a continuous magnetic field on the electron bunch spread. The impact of this effect on the Multipactor threshold was quantified. \ua9 2013 IEEE

Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models

© 2018 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertisíng or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.[EN] Secondary electron emission has an important role on the triggering of the multipactor effect; therefore, its study and characterization are essential in radio-frequency waveguide applications. In this paper, we propose a theoretical model, based on equivalent circuit models, to properly understand charging and discharging processes that occur in dielectric samples under electron irradiation for secondary electron emission characterization. Experimental results obtained for Pt, Si, GaS, and Teflon samples are presented to verify the accuracy of the proposed model. Good agreement between theory and experiments has been found.The authors would like to thank the European High Power Space Materials Laboratory for its contribution-a laboratory funded by the European Regional Development Fund-a way of making Europe. Many thanks to the University of Valencia (Spain) for supporting this research activity with the internal program "Assistance for temporary stays of invited researchers within the framework of the Subprogramme Attraction of Talent 2015".Bañón, D.; Socuellamos, JM.; Mata-Sanz, R.; Mercadé-Morales, L.; Gimeno Martínez, B.; Boria Esbert, VE.; Raboso García-Baquero, D.... (2018). Study of the Secondary Electron Yield in Dielectrics Using Equivalent Circuital Models. IEEE Transactions on Plasma Science. 46(4):859-867. https://doi.org/10.1109/TPS.2018.2809602S85986746