Bloch inductance in small-capacitance Josephson junctions

We show that the electrical impedance of a small-capacitance Josephson junction includes besides the capacitive term $-i/\omega C_B$ also an inductive term $i\omega L_B$. Similar to the known Bloch capacitance $C_B(q)$, the Bloch inductance $L_B(q)$ also depends periodically on the quasicharge $q$, and its maximum value achieved at $q=e (\textrm{mod} 2e)$ always exceeds the value of the Josephson inductance of this junction $L_J(\phi)$ at fixed $\phi=0$. The effect of the Bloch inductance on the dynamics of a single junction and a one-dimensional array is described.Comment: 5 pages incl. 3 fig

Thue-Morse constant is not badly approximable

We prove that Thue–Morse constant τTM=0.01101001…2 is not a badly approximable number. Moreover, we prove that τTM(a)=0.01101001…a is not badly approximable for every integer base a≥2 such that a is not divisible by 15. At the same time, we provide a precise formula for convergents of the Laurent series f~TM(z)=z−1∏∞n=1(1−z−2n), thus developing further the research initiated by Alf van der Poorten and others

Aluminum Single Electron Transistors with Islands Isolated from a Substrate

The low-frequency noise figures of single-electron transistors (electrometers) of traditional planar and new stacked geometry were compared. We observed a correlation between the charge noise and the contact area of the transistor island with a dielectric substrate in the set of Al transistors located on the same chip and having almost similar electric parameters. We have found that the smaller the contact area the lower the noise level of the transistor. The lowest noise value 8*10E-6 e/sqrt(Hz) at f = 10 Hz. has been measured in a stacked transistor with an island which was completely isolated from a substrate. Our measurements have unambiguously indicated that the dominant source of the background charge fluctuations is associated with a dielectric substrateComment: Review paper, latex, 10 pages, 7 figures, to be publ. in JLTP, 2000; Proceeding of "Electron Transport in Mesoscopic Systems", August 12-15, 1999 Geteborg, Sweden, http://fy.chalmers.se/meso_satellite/index.html See also LT22 manuscript: http://lt22.hut.fi/cgi/view?id=S1113

Metallic single-electron transistor without traditional tunnel barriers

We report on a new type of single-electron transistor (SET) comprising two highly resistive Cr thin-film strips (~ 1um long) connecting a 1 um-long Al island to two Al outer electrodes. These resistors replace small-area oxide tunnel junctions of traditional SETs. Our transistor with a total asymptotic resistance of 110 kOhm showed a very sharp Coulomb blockade and reproducible, deep and strictly e-periodic gate modulation in wide ranges of bias currents I and gate voltages V_g. In the Coulomb blockade region (|V| < 0.5 mV), we observed a strong suppression of the cotunneling current allowing appreciable modulation curves V-V_g to be measured at currents I as low as 100 fA. The noise figure of our SET was found to be similar to that of typical Al/AlOx/Al single-electron transistors.Comment: 5 pages incl. 4 fig

Noise in Al single electron transistors of stacked design

We have fabricated and examined several Al single electron transistors whose small islands were positioned on top of a counter electrode and hence did not come into contact with a dielectric substrate. The equivalent charge noise figure of all transistors turned out to be surprisingly low, (2.5 - 7)*10E-5 e/sqrt(Hz) at f = 10 Hz. Although the lowest detected noise originates mostly from fluctuations of background charge, the noise contribution of the tunnel junction conductances was, on occasion, found to be dominant.Comment: 4 pages of text with 1 table and 5 figure

Dynamics of Josephson junctions and single-flux-quantum networks with superconductor-insulator-normal metal junction shunts

Within the framework of the microscopic model of tunneling, we modelled the behavior of the Josephson junction shunted by the Superconductor-Insulator-Normal metal (SIN) tunnel junction. We found that the electromagnetic impedance of the SIN junction yields both the frequency-dependent damping and dynamic reactance which leads to an increase in the effective capacitance of the circuit. We calculated the dc I-V curves and transient characteristics of these circuits and explained their quantitative differences to the curves obtained within the resistively shunted junction model. The correct operation of the basic single-flux-quanta circuits with such SIN-shunted junctions, i.e. the Josephson transmission line and the toggle flip-flop, have also been modelled.Comment: 8 pages incl. 7 figure

Josephson charge-phase qubit with radio frequency readout: coupling and decoherence

The charge-phase Josephson qubit based on a superconducting single charge transistor inserted in a low-inductance superconducting loop is considered. The loop is inductively coupled to a radio-frequency driven tank circuit enabling the readout of the qubit states by measuring the effective Josephson inductance of the transistor. The effect of qubit dephasing and relaxation due to electric and magnetic control lines as well as the measuring system is evaluated. Recommendations for operation of the qubit in magic points producing minimum decoherence are given.Comment: 11 pages incl. 6 fig