Bistable nanoelectromechanical devices

A combined transmission electron microscopy-scanning tunneling microscopy (TEM-STM) technique has been used to investigate the force interactions of silicon and germanium nanowires with gold electrodes. The I(V) data obtained typically show linear behavior between the gold electrode and silicon nanowires at all contact points, whereas the linearity of I(V) curves obtained for germanium nanowires were dependent on the point of contact. Bistable silicon and germanium nanowire-based nanoelectromechanical programmable read-only memory (NEMPROM) devices were demonstrated by TEM-STM. These nonvolatile NEMPROM devices have switching potentials as low as 1 V and are highly stable making them ideal candidates for low-leakage electronic devices. (C) 2004 American Institute of Physics. (DOI:10.1063/1.1751622

Particle-Like Solutions of the Einstein-Dirac Equations

The coupled Einstein-Dirac equations for a static, spherically symmetric system of two fermions in a singlet spinor state are derived. Using numerical methods, we construct an infinite number of soliton-like solutions of these equations. The stability of the solutions is analyzed. For weak coupling (i.e., small rest mass of the fermions), all the solutions are linearly stable (with respect to spherically symmetric perturbations), whereas for stronger coupling, both stable and unstable solutions exist. For the physical interpretation, we discuss how the energy of the fermions and the (ADM) mass behave as functions of the rest mass of the fermions. Although gravitation is not renormalizable, our solutions of the Einstein-Dirac equations are regular and well-behaved even for strong coupling.Comment: 31 pages, LaTeX, 21 PostScript figures, some references adde

A single electron transistor on an atomic force microscope probe

We report fabrication as well as proof-of-concept experiments of a noninvasive sensor of weak nanoscale electric fields. The sensor is a single electron transistor (SET) placed at the tip of a noncontact atomic force microscope (AFM). This is a general technology to make any nanometer-sized lithography pattern at edges or tips of a cantilever. The height control of the AFM allows the SET to hover a few nanometers above the substrate, improving both the electric field sensitivity and lateral resolution of the electrometer. Our AFM-SET sensor is prepared by a scalable technology. It means that the probe can be routinely fabricated and replaced, if broken