2,903 research outputs found

    Prospects for measuring the electric dipole moment of the electron using electrically trapped polar molecules

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    Heavy polar molecules can be used to measure the electric dipole moment of the electron, which is a sensitive probe of physics beyond the Standard Model. The value is determined by measuring the precession of the molecule's spin in a plane perpendicular to an applied electric field. The longer this precession evolves coherently, the higher the precision of the measurement. For molecules in a trap, this coherence time could be very long indeed. We evaluate the sensitivity of an experiment where neutral molecules are trapped electrically, and compare this to an equivalent measurement in a molecular beam. We consider the use of a Stark decelerator to load the trap from a supersonic source, and calculate the deceleration efficiency for YbF molecules in both strong-field seeking and weak-field seeking states. With a 1s holding time in the trap, the statistical sensitivity could be ten times higher than it is in the beam experiment, and this could improve by a further factor of five if the trap can be loaded from a source of larger emittance. We study some effects due to field inhomogeneity in the trap and find that rotation of the electric field direction, leading to an inhomogeneous geometric phase shift, is the primary obstacle to a sensitive trap-based measurement.Comment: 22 pages, 7 figures, prepared for Faraday Discussion 14

    Improved surface quality of anisotropically etched silicon {111} planes for mm-scale integrated optics

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    We have studied the surface quality of millimeter-scale optical mirrors produced by etching CZ and FZ silicon wafers in potassium hydroxide to expose the {111}\{111\} planes. We find that the FZ surfaces have four times lower noise power at spatial frequencies up to 500 mm−1500\, {mm}^{-1}. We conclude that mirrors made using FZ wafers have higher optical quality

    Stochastic multi-channel lock-in detection

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    High-precision measurements benefit from lock-in detection of small signals. Here we discuss the extension of lock-in detection to many channels, using mutually orthogonal modulation waveforms, and show how the the choice of waveforms affects the information content of the signal. We also consider how well the detection scheme rejects noise, both random and correlated. We address the particular difficulty of rejecting a background drift that makes a reproducible offset in the output signal and we show how a systematic error can be avoided by changing the waveforms between runs and averaging over many runs. These advances made possible a recent measurement of the electron's electric dipole moment.Comment: 11 pages, 3 figure

    Measurement of the lowest millimetre-wave transition frequency of the CH radical

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    The CH radical offers a sensitive way to test the hypothesis that fundamental constants measured on earth may differ from those observed in other parts of the universe. The starting point for such a comparison is to have accurate laboratory frequencies. Here we measure the frequency of the lowest millimetre-wave transition of CH, near 535 GHz, with an accuracy of 0.6 kHz. This improves the uncertainty by roughly two orders of magnitude over previous determinations and opens the way for sensitive new tests of varying constants.Comment: 5 pages, 5 figure

    ICP polishing of silicon for high quality optical resonators on a chip

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    Miniature concave hollows, made by wet etching silicon through a circular mask, can be used as mirror substrates for building optical micro-cavities on a chip. In this paper we investigate how ICP polishing improves both shape and roughness of the mirror substrates. We characterise the evolution of the surfaces during the ICP polishing using white-light optical profilometry and atomic force microscopy. A surface roughness of 1 nm is reached, which reduces to 0.5 nm after coating with a high reflectivity dielectric. With such smooth mirrors, the optical cavity finesse is now limited by the shape of the underlying mirror
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