Oxygen Absorption in Free-Standing Porous Silicon: A Structural, Optical and Kinetic Analysis

Porous silicon (PSi) is a nanostructured material possessing a huge surface area per unit volume. In consequence, the adsorption and diffusion of oxygen in PSi are particularly important phenomena and frequently cause significant changes in its properties. In this paper, we study the thermal oxidation of p+-type free-standing PSi fabricated by anodic electrochemical etching. These free-standing samples were characterized by nitrogen adsorption, thermogravimetry, atomic force microscopy and powder X-ray diffraction. The results show a structural phase transition from crystalline silicon to a combination of cristobalite and quartz, passing through amorphous silicon and amorphous silicon-oxide structures, when the thermal oxidation temperature increases from 400 to 900 °C. Moreover, we observe some evidence of a sinterization at 400 °C and an optimal oxygen-absorption temperature about 700 °C. Finally, the UV/Visible spectrophotometry reveals a red and a blue shift of the optical transmittance spectra for samples with oxidation temperatures lower and higher than 700 °C, respectively

Lensless X-ray imaging in reflection geometry

Lensless X-ray imaging techniques such as coherent diffraction imaging and ptychography, and Fourier transform holography can provide time-resolved, diffraction-limited images. Nearly all examples of these techniques have focused on transmission geometry, restricting the samples and reciprocal spaces that can be investigated. We report a lensless X-ray technique developed for imaging in Bragg and small-angle scattering geometries, which may also find application in transmission geometries. We demonstrate this by imaging a nanofabricated pseudorandom binary structure in small-angle reflection geometry. The technique can be used with extended objects, places no restriction on sample size, and requires no additional sample masking. The realization of X-ray lensless imaging in reflection geometry opens up the possibility of single-shot imaging of surfaces in thin films, buried interfaces in magnetic multilayers, organic photovoltaic and field-effect transistor devices, or Bragg planes in a single crystal

Ptychography

Ptychography is a computational imaging technique. A detector records an extensive data set consisting of many inference patterns obtained as an object is displaced to various positions relative to an illumination field. A computer algorithm of some type is then used to invert these data into an image. It has three key advantages: it does not depend upon a good-quality lens, or indeed on using any lens at all; it can obtain the image wave in phase as well as in intensity; and it can self-calibrate in the sense that errors that arise in the experimental set up can be accounted for and their effects removed. Its transfer function is in theory perfect, with resolution being wavelength limited. Although the main concepts of ptychography were developed many years ago, it has only recently (over the last 10 years) become widely adopted. This chapter surveys visible light, x-ray, electron, and EUV ptychography as applied to microscopic imaging. It describes the principal experimental arrangements used at these various wavelengths. It reviews the most common inversion algorithms that are nowadays employed, giving examples of meta code to implement these. It describes, for those new to the field, how to avoid the most common pitfalls in obtaining good quality reconstructions. It also discusses more advanced techniques such as modal decomposition and strategies to cope with three-dimensional () multiple scattering

Isolated pure verbal amnesia as the disease onset of probable multiple sclerosis with a left forniceal black hole

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Direct determination of strain and composition in InGaAs nano-islands using anomalous grazing incidence x-ray diffraction

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