Photoluminescence characteristics of soft PZT 53/47 ceramic doped at A and/or B sites

Abstract This study presents the photoluminescence characteristics of the PZT 53/47 system doped at A and/or B sites, with Nb (PZTN), La (PLZT), and Nb–La (PLZTN) in the concentration range from 0.2 to 1.0 molar fraction. The intensity of the emission bands of the system PZTN is two orders higher than the intensity of the emission bands of the systems PLZT and PLZTN, and these emission bands are located at 1.73 eV (718 nm), 2.56 eV (485 nm), and 2.93 eV (424 nm). The origin of the luminescence in these systems is associated with lead and oxygen vacancies produced during the sintering process. The results from X-ray diffraction (XRD) show a mixture of rhombohedral and tetragonal phases. The system PZTN shows a higher tetragonal phase concentration, while PLZT and PLZTN systems show a higher rhombohedral phase concentration. The cell volume shows an increase with dopant concentration only in the case of the PLZTN system. The band gap energy shows a small variation in the PZTN and PLZTN cases around 3.0 eV, a close value to the band gap energy of the pure PZT 53/47 sample. The system PLZT shows an increasing behavior until 4.41 eV for the higher dopant concentration

Microestructural and ferroelectric analyses of Pb₁₋₃ₓ/₂Laₓ(Zr₀.₅₄Ti₀.₄₆)₁₋₅ᵧ/₄NbᵧO₃ soft ceramics.

Microstructural and ferroelectric analyses were carried out on Pb₁₋₃ₓ/₂Laₓ(Zr₀.₅₄Ti₀.₄₆)₁₋₅ᵧ/₄NbᵧO₃ ceramics, x = y = 0.004, 0.006, 0.008 and 0.01 mol%. Using Piezoresponse Force Microscopy (PFM) and piezoelectric Hysteresis Loop (HL), ferroelectric behavior, and ferroelectric domain sizes were determined. Grain size (as determinate by SEM) and ferroelectric domain area decrease with the increase of dopant concentration from 3 μm to 1 μm and from 0.56 μm² to 0.32 μm², respectively. The maximum remnant polarization was obtained for Pb₀.₉₈₅La₀.₀₁Zr₀.₅₄Ti₀.₄₆)₀.₉₈₇₅Nb₀.₀₁O₃, showing that samples polarize easier with higher La³⁺ and Nb⁵⁺ dopant concentration. The coercive field does not show significant differences as the La and Nb content is varied. Grains tend to be single crystals as the La³⁺ and Nb⁵⁺ dopant concentration is increased.Análisis microestructural y ferroeléctrico de cerámicas suaves de Pb₁₋₃ₓ/₂Laₓ(Zr₀.₅₄Ti₀.₄₆)₁₋₅ᵧ/₄NbᵧO₃ Se realizaron análisis microestructurales y ferroeléctricos en cerámicas de Pb₁₋₃ₓ/₂Laₓ(Zr₀.₅₄Ti₀.₄₆)₁₋₅ᵧ/₄NbᵧO₃, x = y = 0.004, 0.006, 0.008 y 0.01% en moles. Se utilizó microscopía de fuerza de respuesta piezoeléctrica (PFM) y lazo de histéresis piezoeléctrica (HL), se determinó el comportamiento ferroeléctrico y el tamaño de dominio ferroeléctrico. El tamaño de grano (determinado por SEM) y el área del dominio ferroeléctrico disminuyen con el aumento de la concentración del dopante de 3 μm a 1 μm y de 0,56 μm² a 0,32 μm², respectivamente. La máxima polarización remanente se obtuvo para Pb₀.₉₈₅La₀.₀₁Zr₀.₅₄Ti₀.₄₆)₀.₉₈₇₅Nb₀.₀₁O₃, lo que demuestra que las muestras se polarizan más fácilmente con una mayor concentración de dopante La³⁺ y Nb⁵⁺. El campo coercitivo no presenta diferencias significativas ya que el contenido de La y Nb es variado. Los granos tienden a ser monocristales a medida que aumenta la concentración de los dopantes La3 + Nb5+