Experimental results on radiation-induced bulk damage effects in float-zone and epitaxial silicon detectors

A comparative study of the radiation hardness of silicon pad detectors, manufactured from Float-Zone and Epitaxial n-type monocrystals and irradiated with protons and neutrons up to a fluence of 3.5 1014 cm-2 is presented. The results are compared in terms of their reverse current, depletion voltage, and charge collection as a function of fluence during irradiation and as a function of time after irradiation

Study of charge collection and noise in non-irradiated and irradiated silicon detectors

The large collection and noise were studied in non-irradiated and irradiated silicon detectors as a function of temperature (T), shaping time (0) and fluence , up to about 1,2 x 10(14) protons per cm2 for minimum-ionizing electrons yielded by a 106 Ru source. The noise of irradiated detectors is found to be dominted for short shaping times (¾50ns) by a series noise compo- nent, while for longer shaping times (80ns) a parallel noise component (correlated with the reverse current) prevails. For non-irradiated detectors, where the reverse current is three orders of magnetude smaller compared with irradiated detectors, the series noises dominates over the whole range of shaping times investigated (20-150ns). A signal degradation is observed for irradiated detectors. However, the signal ca be distinguished from noise, even after a fluence of about 1.2 x10(14) protons per cm2, at a temperature of 6øC and with a shaping time tipical of rge LHC inter-bunch crossing time (20-30ns). The measurements of the signal as a function of voltage shows that irradiated detectors depleted at 50% of the full depletion voltage can still provide a measurable signal-to-noise ratio

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Improved neutron radiation hardness for Si detectors: Application of low resistivity starting material and or manipulation of N-eff by selective filling of radiation-induced traps at low temperatures

Radiation-induced electrical changes in both space charge region (SCR) of Si detectors and bulk material (BM) have been studied for samples of diodes and resistors made on Si materials with different initial resistivities. The space charge sign inversion fluence (Phi(inv)) has been found to increase linearly with the initial doping concentration (the reciprocal of the resistivity), which gives improved radiation hardness to Si detectors fabricated from low resistivity material. The resistivity of the BM, on the other hand, has been observed to increase with the neutron fluence and approach a saturation value in the order of hundreds k Omega cm at high fluences, independent of the initial resistivity and material type. However, the fluence (Phi(s)), at which the resistivity saturation starts, increases with the initial doping concentrations and the value of Phi(s) is in the same order of that of Phi(inv) for all resistivity samples. Improved radiation hardness can also be achieved by the manipulation of the space charge concentration (N-eff) in SCR, by selective filling and/or freezing at cryogenic temperatures the charge state of radiation-induced traps, to values that will give a much smaller full depletion voltage. Models have been proposed to explain the experimental data

Improved neutron radiation hardness for Si detectors: Application of low resistivity starting material and or manipulation of N-eff by selective filling of radiation-induced traps at low temperatures

Radiation-induced electrical changes in both space charge region (SCR) of Si detectors and bulk material (BM) have been studied for samples of diodes and resistors made on Si materials with different initial resistivities. The space charge sign inversion fluence (Phi(inv)) has been found to increase linearly with the initial doping concentration (the reciprocal of the resistivity), which gives improved radiation hardness to Si detectors fabricated from low resistivity material. The resistivity of the BM, on the other hand, has been observed to increase with the neutron fluence and approach a saturation value in the order of hundreds k Omega cm at high fluences, independent of the initial resistivity and material type. However, the fluence (Phi(s)), at which the resistivity saturation starts, increases with the initial doping concentrations and the value of Phi(s) is in the same order of that of Phi(inv) for all resistivity samples. Improved radiation hardness can also be achieved by the manipulation of the space charge concentration (N-eff) in SCR, by selective filling and/or freezing at cryogenic temperatures the charge state of radiation-induced traps, to values that will give a much smaller full depletion voltage. Models have been proposed to explain the experimental data

Radiation hard detectors from silicon enriched with both oxygen and thermal donors: improvements in donor removal and long-term stability with regard to neutron irradiation

Detectors made on the silicon wafers with high concentration of thermal donors (TD), which were introduced during the high temperature long time (HTLT) oxygenation procedure, have been investigated in the study of radiation hardness with regard to neutron irradiation and donor removal problems in irradiated high resistivity Si detectors. Two facts have been established as the evidence of radiation hardness improvement of HTLT(TD) Si detectors irradiated below approx 10 sup 1 sup 4 n/cm sup 2 compared to detectors made on standard silicon wafers: the increase of space charge sign inversion fluence (of 1 MeV neutrons) due to lower initial Si resistivity dominated by TD, and the gain in the reverse annealing time constant tau favourable for this material. Coupled with extremely high radiation tolerance to protons observed earlier ('beta zero' behaviour in a wide range of fluence), detectors from HTLT(TD) Si may be unique for application in the experiments with multiple radiations. The changes in the effective space charge density (N sub e sub f sub f) in as-irradiated detectors as a function of neutron fluence have been fitted using three different models. It has been shown that a new model with a universal donor removal rate for both materials, and considering the contribution of non-removable TD to the N sub e sub f sub f provides good fit to the experimental data. A defect level related to TD has been observed in DLTS spectra of HTLT Si(TD) near T approx 75 K. The physics of donor removal in irradiated silicon detectors is discussed