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1 research outputs found
On label dependence in multilabel classification
Author
Cheng Weiwei
Dembszynski Krzysztof
Hüllermeier Eyke
Waegeman Willem
Publication venue
Ghent University, KERMIT, Department of Applied Mathematics, Biometrics and Process Control
Publication date
01/01/2010
Field of study
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Ghent University Academic Bibliography
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