Dynamic Calibration of Higher Eigenmode Parameters of a Cantilever in Atomic Force Microscopy Using Tip-Surface Interactions

We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever responsivity) of a cantilever. The method is based on the tip-surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip-surface interaction. The calibration method proposed requires a single-point force measurement using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.Comment: 4 pages, 4 figure

Interpreting motion and force for narrow-band intermodulation atomic force microscopy

Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple tones in a frequency comb. A high $Q$ cantilever resonance and a suitable drive comb will result in tip motion described by a narrow-band frequency comb. We show by a separation of time scales, that such motion is equivalent to rapid oscillations at the cantilever resonance with a slow amplitude and phase or frequency modulation. With this time domain perspective we analyze single oscillation cycles in ImAFM to extract the Fourier components of the tip-surface force that are in-phase with tip motion ($F_I$) and quadrature to the motion ($F_Q$). Traditionally, these force components have been considered as a function of the static probe height only. Here we show that $F_I$ and $F_Q$ actually depend on both static probe height and oscillation amplitude. We demonstrate on simulated data how to reconstruct the amplitude dependence of $F_I$ and $F_Q$ from a single ImAFM measurement. Furthermore, we introduce ImAFM approach measurements with which we reconstruct the full amplitude and probe height dependence of the force components $F_I$ and $F_Q$, providing deeper insight into the tip-surface interaction. We demonstrate the capabilities of ImAFM approach measurements on a polystyrene polymer surface.Comment: 12 pages, 7 figure

Quantum Phase Slips in one-dimensional Josephson Junction Chains

We have studied quantum phase-slip (QPS) phenomena in long one-dimensional Josephson junction series arrays with tunable Josephson coupling. These chains were fabricated with as many as 2888 junctions, where one sample had a tunable weak link in the middle. Measurements were made of the zero-bias resistance, $R_0$, as well as current-voltage characteristics (IVC). The finite $R_0$ is explained by QPS and shows an exponential dependence on $\sqrt{E_J/E_C}$ with a distinct change in the exponent at $R_0=R_Q=h/4e^2$. When $R_0 > R_Q$ the IVC clearly shows a remnant of the Coulomb blockade, which evolves to a zero-current state with a sharp critical voltage as $E_J$ is tuned to a smaller value. The zero-current state below the critical voltage is due to coherent QPS and we show that these are enhanced at the central weak link. Above the critical voltage a negative differential resistance is observed which nearly restores the zero-current state

Coulomb Blockade and Coherent Single-Cooper-Pair Tunneling in Single Josephson Junctions

We have measured the current-voltage characteristics of small-capacitance single Josephson junctions at low temperatures (T < 0.04 K), where the strength of the coupling between the single junction and the electromagnetic environment was controlled with one-dimensional arrays of dc SQUIDs. We have clearly observed Coulomb blockade of Cooper-pair tunneling and even a region of negative differential resistance, when the zero-bias resistance of the SQUID arrays is much higher than the quantum resistance h/e^2 = 26 kohm. The negative differential resistance is evidence of coherent single-Cooper-pair tunneling in the single Josephson junction.Comment: RevTeX, 4 pages with 6 embedded figure

Imaging high-speed friction at the nanometer scale

Friction is a complicated phenomenon involving nonlinear dynamics at different length and time scales[1, 2]. The microscopic origin of friction is poorly understood, due in part to a lack of methods for measuring the force on a nanometer-scale asperity sliding at velocity of the order of cm/s.[3, 4] Despite enormous advance in experimental techniques[5], this combination of small length scale and high velocity remained illusive. Here we present a technique for rapidly measuring the frictional forces on a single asperity (an AFM tip) over a velocity range from zero to several cm/s. At each image pixel we obtain the velocity dependence of both conservative and dissipative forces, revealing the transition from stick-slip to a smooth sliding friction[1, 6]. We explain measurements on graphite using a modified Prandtl-Tomlinson model that takes into account the damped elastic deformation of the asperity. With its greatly improved force sensitivity and very small sliding amplitude, our method enables rapid and detailed surface mapping of the full velocity-dependence of frictional forces with less than 10~nm spatial resolution.Comment: 7 pages, 4 figure