104 research outputs found

    Fine mapping of barley locus Rps6 conferring resistance to wheat stripe rust

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    [EN] Wheat stripe rust, caused by Puccinia striiformis f. sp. tritici (Pst), is a major disease of wheat that is causing large economic losses in many wheat-growing regions of the world. Deployment of Pst resistance genes has been an effective strategy for controlling this pathogen, but many of these genes have been defeated by new Pst races. In contrast, genes providing resistance to this wheat pathogen in other grass species (nonhost resistance) have been more durable. Barley varieties (Hordeum vulgare ssp. vulgare) are predominately immune to wheat Pst, but we identified three accessions of wild barley (Hordeum vulgare ssp. spontaneum) that are susceptible to Pst. Using these accessions, we mapped a barley locus conferring resistance to Pst on the distal region of chromosome arm 7HL and designated it as Rps6. The detection of the same locus in the cultivated barley ‘Tamalpais’ and in the Chinese barley ‘Y12’ by an allelism test suggests that Rps6 may be a frequent component of barley intermediate host resistance to Pst. Using a high-density mapping population (>10,000 gametes) we precisely mapped Rps6 within a 0.14 cM region (~500 kb contig) that is colinear to regions in Brachypodium (<94 kb) and rice (<9 kb). Since no strong candidate gene was identified in these colinear regions, a dedicated positional cloning effort in barley will be required to identify Rps6. The identification of this and other barley genes conferring resistance to Pst can contribute to our understanding of the mechanisms for durable resistance against this devastating wheat pathogenSIDr. Fu acknowledges support from the National Natural Science Foundation of China (31110103917), the National Basic Research Program of China (2013CB127700 and 2011CB100700), the Tai’shan Scholar Program of Shandong Province, China, and the Cooperative Innovation Center of Efficient Production with High Annual Yield of Wheat and Corn, Shandong Province, China. Dr. Dubcovsky acknowledges support from the NRI grant 2011-68002-30029 (TCAP) from the USDA National Institute of Food and Agriculture, by the Borlaug Global Rust Initiative, and by the Howard Hughes Medical Institute and the Gordon and Betty Moore Foundation Grant GBMF303

    RNA interference for wheat functional gene analysis.

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    Technology for Production of Wheat Doubled Haploid via Maize Pollen Induction—Updated Review

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    Chromosome elimination resulting in haploids is achieved by rapid loss of chromosomes from one parent during the zygote stage and is an important procedure to produce doubled haploid (DH) lines in plants. During crosses between an emasculated wheat (Triticum aestivum L.) and maize (Zea mays L.) as pollen donors, the complete loss of maize chromosomes results in wheat haploid embryos. Through embryo rescue and chromosome doubling processes, pure lines with stable traits can be quickly obtained. The technique is called the “Wheat × Maize System”. Although this technology is not new, it remains a practical approach to date. In order to optimize and improve this technology and to achieve its maximum potential in the winter wheat area of China, this paper reviews the previous and ongoing research and technical procedures for the production of wheat DH lines via the maize pollen induction and presents outlooks on DH research and its application in wheat breeding
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