Synchrotron x-ray topographic and high-resolution diffraction analysis of mask-induced strain in epitaxial laterally overgrown GaAs layers

Synchrotron x-ray back reflection section topographs of epitaxial lateral overgrown (ELO) GaAs samples grown on (001) GaAs substrates show images of the GaAs layers bent due to the interaction between the layer and the SiO2 mask. The topographs are simulated under the assumption of orientational contrast. Using the same data the measured x-ray diffraction curve is simulated. The calculations, which are in good agreement with the measurements, are used to gain information on the tilted (001) lattice planes in each ELO layer. We show that the bending of ELO lattice planes reaches a maximum at the center of the ELO stripes, where misorientation is at a minimum, and decreases towards the edges of the stripes, where misorientation reaches a maximum

On the use of total reflection x-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge–Si heterostructure

Synchrotron x-ray topography was used in total reflection topography (TRT) mode to observe strain-induced surface bumps due to the presence of underlying misfit dislocations in strained-layer SiGe on Si epitaxial heterostructures. In these experiments, the x rays approached the sample surfaces at grazing incident angles below the critical angles for total external reflection for a number of reflections, and hence, surface strain features nominally less than a few tens of angstrøms from the sample surface have been observed. These are similar to the surface bumpiness observed by atomic force microscopy, albeit on a much larger lateral length scale. The fact that TRT mode images were taken was confirmed by the observation of conventional backreflection topographic images of misfit dislocations in all samples when the grazing incidence angle became greater than the critical angle

On the Retrieval of the Beam Transverse Wind Velocity Using Angles of Arrival from Spatially Separated Light Sources

For optical propagation through the turbulent atmosphere, the angle of arrival (AOA) cross-correlation function obtained from two spatially separated light sources carries information regarding the transverse wind velocity averaged along the propagation path. Two methods for the retrieval of the beam transverse horizontal wind velocity, v_t, based on the estimation of the time delay to the peak and the slope at zero lag of the AOA cross-correlation function, are presented. Data collected over a two week long experimental campaign conducted at the Boulder Atmospheric Observatory (BAO) site near Erie, CO was analyzed. The RMS difference between 10 s estimates of v_t retrieved optically, and 10 s averages of the transverse horizontal wind velocity measured by an ultrasonic anemometer, was found to be 14 cm/s for the time-delay-to- peak method and 20 cm/s for the slope-at-zero-lag method, for a 2 h period beginning 0345 MDT on 16 June, 2010, during which the transverse horizontal wind velocity varied between -1 m/s and 2 m/s