25,947 research outputs found

    Quantum critical behaviour of the plateau-insulator transition in the quantum Hall regime

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    High-field magnetotransport experiments provide an excellent tool to investigate the plateau-insulator phase transition in the integral quantum Hall effect. Here we review recent low-temperature high-field magnetotransport studies carried out on several InGaAs/InP heterostructures and an InGaAs/GaAs quantum well. We find that the longitudinal resistivity ρxx\rho_{xx} near the critical filling factor νc\nu_{c} ~ 0.5 follows the universal scaling law ρxx(ν,T)∝exp[−Δν/(T/T0)κ]\rho_{xx}(\nu, T) \propto exp[-\Delta \nu/(T/T_{0})^{\kappa}], where Δν=ν−νc\Delta \nu =\nu -\nu_{c}. The critical exponent κ\kappa equals 0.56±0.020.56 \pm 0.02, which indicates that the plateau-insulator transition falls in a non-Fermi liquid universality class.Comment: 8 pages, accepted for publication in Proceedings of the Yamada Conference LX on Research in High Magnetic Fields (August 16-19, 2006, Sendai

    Cleaning the USNO-B Catalog through automatic detection of optical artifacts

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    The USNO-B Catalog contains spurious entries that are caused by diffraction spikes and circular reflection halos around bright stars in the original imaging data. These spurious entries appear in the Catalog as if they were real stars; they are confusing for some scientific tasks. The spurious entries can be identified by simple computer vision techniques because they produce repeatable patterns on the sky. Some techniques employed here are variants of the Hough transform, one of which is sensitive to (two-dimensional) overdensities of faint stars in thin right-angle cross patterns centered on bright (<13 \mag) stars, and one of which is sensitive to thin annular overdensities centered on very bright (<7 \mag) stars. After enforcing conservative statistical requirements on spurious-entry identifications, we find that of the 1,042,618,261 entries in the USNO-B Catalog, 24,148,382 of them (2.3 \percent) are identified as spurious by diffraction-spike criteria and 196,133 (0.02 \percent) are identified as spurious by reflection-halo criteria. The spurious entries are often detected in more than 2 bands and are not overwhelmingly outliers in any photometric properties; they therefore cannot be rejected easily on other grounds, i.e., without the use of computer vision techniques. We demonstrate our method, and return to the community in electronic form a table of spurious entries in the Catalog.Comment: published in A
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