50 research outputs found

    Improved measurement results for the Avogadro constant using a 28Si-enriched crystal

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    New results are reported from an ongoing international research effort to accurately determine the Avogadro constant by counting the atoms in an isotopically enriched silicon crystal. The surfaces of two 28Si-enriched spheres were decontaminated and reworked in order to produce an outer surface without metal contamination and improved sphericity. New measurements were then made on these two reconditioned spheres using improved methods and apparatuses. When combined with other recently refined parameter measurements, the Avogadro constant derived from these new results has a value of NA=6.02214076(12)×1023N_A = 6.022 140 76(12) \times 10^{23} mol−1^{-1}. The X-ray crystal density method has thus achieved the target relative standard uncertainty of 2.0×10−82.0 \times 10^{-8} necessary for the realization of the definition of the new kilogram.Comment: postprint, 22 page, 3 figures, 14 table

    High accuracy X ray detector calibration based on cryogenic radiometry

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    Characterization of a quadrant diamond transmission X ray detector including a precise determination of the mean electron hole pair creation energy

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    Precise monitoring of the incoming photon flux is crucial for many experiments using synchrotron radiation. For photon energies above a few keV, thin semiconductor photodiodes can be operated in transmission for this purpose. Diamond is a particularly attractive material as a result of its low absorption. The responsivity of a state-of-the art diamond quadrant transmission detector has been determined, with relative uncertainties below 1% by direct calibration against an electrical substitution radiometer. From these data and the measured transmittance, the thickness of the involved layers as well as the mean electron–hole pair creation energy were determined, the latter with an unprecedented relative uncertainty of 1%. The linearity and X-ray scattering properties of the device are also described.</jats:p

    X ray pencil beam facility for optics characterization

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