4 research outputs found
Strong influence of the Pd-Si ratio on the valence transition in EuPdSi single crystals
Single crystals of intermediate valent EuPdSi were grown from an
Eu-rich melt by the Bridgman as well as the Czochralski technique. The chemical
and structural characterization of an extracted single crystalline
Czochralski-grown specimen yielded a slight variation of the Si-Pd ratio along
the growth direction and confirms the existence of a finite
Eu(PdSi) homogeneity range. The thorough physical
characterization carried out on the same crystal showed that this tiny
variation in the composition strongly affects the temperature T at which
the valence transition occurs. These experiments demonstrate a strong coupling
between structural and physical properties in the prototypical
valence-fluctuating system EuPdSi and explain the different reported
values of T
Axial Inhomogeneity of Mg-Doped GaN Rods: A Strong Correlation among Componential, Electrical, and Optical Analyses
We systematically characterized the
inhomogeneous doping properties
along the <i>c</i>-axis of Mg-doped <i>p</i>-GaN
microrods. Axial variation of doping concentration and electrical
resistance on the <i>p</i>-GaN rod were measured by time-of-flight
secondary-ion-mass-spectrometry and four-point probe measurements,
respectively. Defects-related optical information was obtained from
photoluminescence spectra together with Raman experiments revealing
the change of crystal quality and strain along the rod. On the basis
of a correlation of these analyses, we confirmed that Mg concentration
decreased along the axial direction of the rod, leading to increasing
electrical resistance. This axial Mg concentration change was revealed
by green luminescence because the intensity of green luminescence
sensitively varied with the doping density in both high-doping and
low-doping rods. Interestingly, all the resistances at the highly
doped rods were higher than the lowly doped rods due to overall mobility
degradation at the high-doping rods caused by a scattering effect
of increased Mg impurities and strain. All analyses provided complementary
information on the <i>p</i>-type doping process and contribute
to understanding the <i>p</i>-doping properties of GaN rod
based photonic devices. Furthermore, our axially resolved optical
spectroscopic (photoluminescence and Raman) methods can provide a
facile, fast, and nondestructive way to estimate the axial doping
and conductivity inhomogeneity of a Mg-doped <i>p</i>-GaN
rod without having complex, time-consuming, and destructive structural
and electrical measurements