34 research outputs found
Organic optoelectronic devices-flexibility versus performance
International audienceIn this paper, we discuss the effect of flexible substrates on the characteristics of two organic optoelectronic devices, namely P3HT:PCBM-based photovoltaic bulk heterojunctions and pentacene-based phototransistors. In addition, we have developed anode materials deposited by ion beam sputtering, a technique which satisfies the low temperature deposition requirements associated with the use of plastic substrates. The anode materials consisted of indium tin oxide (ITO) and ITO/metal/ITO tri-layers. The use of tri-layer anodes in P3HT:PCBM-based solar cells resulted in an increase in the fill factor and the power conversion efficiency reached a value of 2% with an ITO(70Â nm)/Ag(14Â nm)/ITO(70Â nm) anode deposited on a polyphthalate carbonate substrate. In the case of phototransistors, a photosensitivity of 1.6 Ă 10 under illumination at 365Â nm (with a power intensity of 7Â mW/cm) was obtained in the off-state of the transistor. We have fine-tuned the anode structure and deposition/annealing conditions towards flexible organic devices and optimal device characteristics
Identification de la source de défaut dans une ligne de production du semiconducteur
Un systeÌme de production High-Mix Low-Volume est caracteÌriseÌ par une grande varieÌteÌ de technologies, des faibles volumes de production, et des produits de courte dureÌe de vie. Lâintroduction de la technique dâeÌchantillonnage dynamique aÌ ce systeÌme de production a permis un gain important sur le rendement de production. Cet eÌchantillonnage est baseÌ, en temps reÌel, sur les eÌtats des eÌquipements et sur lâensemble des produits en cours de fabrication. Les meÌthodes classiques dâanalyse des rendements, neÌcessitant un grand nombre de mesure par produit, ne sont plus aussi performantes. Afin dâadapter le diagnostic au nouvel environnement de production, les travaux de cette theÌse proposent une approche de diagnostic qui consiste aÌ localiser lâeÌquipement aÌ lâorigine de deÌfauts dans une ligne de fabrication du semi-conducteur. Elle est composeÌe de trois modules principaux. Le premier module est constitueÌ dâune meÌthode dâidentification de lâeÌquipement en mode de fonctionnement anormal. Cette meÌthode est baseÌe sur lâanalyse dâeÌleÌments communs. Le deuxieÌme est un module de tri de donneÌes. Un algorithme dâalignement de seÌquences a eÌteÌ utiliseÌ afin de comparer les caracteÌristiques des eÌchantillons et calculer le taux de similariteÌ. Le troisieÌme module est lâeÌchantillonnage reÌactif pour le diagnostic. Cet eÌchantillonnage est baseÌ sur un modeÌle dâoptimisation lineÌaire qui permet de trouver lâeÌquilibre entre le nombre dâeÌchantillons et le temps dâanalyse. Lâapproche proposeÌe est valideÌe sur des donneÌes expeÌrimentales issues de la ligne de fabrication de la compagnie STMicroelectronics aÌ Rousset-France.High-Mix Low-Volume manufacturing process is characterized by a wide variety of technologies, low production volumes, and short cycle time of products. The introduction of dynamic sampling technique in this system has enabled a significant improvement of production gain. The dynamic sampling is based on the equipment states and the set of products being manufactured. The yield enhancement methods requiring aÌ large number of measurements by product, are no more efficient. In order to adapt the diagnosis method to the new manufacturing environment, this thesis provides a defect source identification method applied to semiconductor manufacturing process. It is composed of three main modules. The first module aim to identify the faulty process equipment. This module is based on the tool commonality analysis approach. The second module consists in sorting the products. A Sequence Alignment Algorithm has been used in order to compare the sample characteristics and to calculate the similarity degree. The third module is a reactive sampling method for the diagnosis. This method is based on a linear optimization algorithm that allows finding the tradeoff between the number of samples and the analysis time. The proposed approach has been approved on real data from STMicroelectronics manufacturing line in Rousset-France
Improvement of organic solar cell performance with ITO/Au/ITO anodes
International audienc
Ălectrode ITO/Ag/ITO dans un dispositif photovoltaĂŻque organique
Communication par affiche . Matériaux et Nanostructures -Conjugués 2009 (MNPC'09), Arcachon France, 19-23 Octobre 200
Buffer layer influence on organic solar cell lifetime
International audienc