699 research outputs found

    Exceptional Point of Degeneracy in Linear-Beam Tubes for High Power Backward-Wave Oscillators

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    Abstract An exceptional point of degeneracy (EPD) is induced in a system made of an electron beam interacting with an electromagnetic (EM) guided mode. This enables a degenerate synchronous regime in backward wave oscillators (BWOs) where the electron beams provides distributed gain to the EM mode with distributed power extraction. Current particle-in-cell simulation results demonstrate that BWOs operating at an EPD have a starting-oscillation current that scales quadratically to a non-vanishing value for long interaction lengths and therefore have higher power conversion efficiency at arbitrarily higher level of power generation compared to standard BWOs

    Exceptional Point of Degeneracy in Backward-Wave Oscillator with Distributed Power Extraction

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    We show how an exceptional point of degeneracy (EPD) is formed in a system composed of an electron beam interacting with an electromagnetic mode guided in a slow wave structure (SWS) with distributed power extraction from the interaction zone. Based on this kind of EPD, a new regime of operation is devised for backward wave oscillators (BWOs) as a synchronous and degenerate regime between a backward electromagnetic mode and the charge wave modulating the electron beam. Degenerate synchronization under this EPD condition means that two complex modes of the interactive system do not share just the wavenumber, but they rather coalesce in both their wavenumbers and eigenvectors (polarization states). In principle this new condition guarantees full synchronization between the electromagnetic wave and the beam's charge wave for any amount of output power extracted from the beam, setting the threshold of this EPD-BWO to any arbitrary, desired, value. Indeed, we show that the presence of distributed radiation in the SWS results in having high-threshold electron-beam current to start oscillations which implies higher power generation. These findings have the potential to lead to highly efficient BWOs with very high output power and excellent spectral purity

    Enantiospecific Detection of Chiral Nanosamples Using Photoinduced Force

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    We propose a high-resolution microscopy technique for enantiospecific detection of chiral samples down to sub-100-nm size based on force measurement. We delve into the differential photoinduced optical force ΔF exerted on an achiral probe in the vicinity of a chiral sample when left and right circularly polarized beams separately excite the sample-probe interactive system. We analytically prove that ΔF is entangled with the enantiomer type of the sample enabling enantiospecific detection of chiral inclusions. Moreover, we demonstrate that ΔF is linearly dependent on both the chiral response of the sample and the electric response of the tip and is inversely related to the quartic power of probe-sample distance. We provide physical insight into the transfer of optical activity from the chiral sample to the achiral tip based on a rigorous analytical approach. We support our theoretical achievements by several numerical examples highlighting the potential application of the derived analytic properties. Lastly, we demonstrate the sensitivity of our method to enantiospecify nanoscale chiral samples with chirality parameter on the order of 0.01 and discuss how the sensitivity of our proposed technique can be further improved
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