TOTAL IONIZING DOSE EFFECTS AND RADIATION TESTING

Total ionizing dose (TID) effects and radiation tests of complex multifunctional Very-large-scale integration (VLSI) integrated circuits (ICs) rise up some particularities as compared to conventional "simple" ICs. The main difficulty is to organize informative and quick functional test dirctly under irradiation. Functional tests approach specified for complex multifunctional VLSI devices is presented and the basic radiation test procedure is discussed in application to some typical examples. 

METHOD FOR INTEGRATED CIRCUITS TOTAL IONIZING DOSE HARDNESS TESTING BASED ON COMBINED GAMMA- AND X-RAY IRRADIATION FACILITIES

A method is proposed to test microelectronic parts total ionizing dose hardness based on a rationally balanced combination of gamma- and X-ray irradiation facilities. The scope of this method is identified, and a step-by-step algorithm of combined testing is provided, along with a test example of the method application

Vibra-Sensors PXI-Based Test Complex Controlled by Labview

The article devoted to construction of an automated test complex for parametric and functional control of vibra-sensors ICs (such as integrated accelerometers and MEMS-generators). The test complex based on PXI-standard measurement devices and controlled by LabVIEW soft. The complex’s characteristics was confirmed by calibration service and been certified

Testing System for Analog Devices Direct Digital Synthesizer

The paper is devoted to the setup for controlling and testing of Direct Digital Synthesizer (DDS) Integrated Circuits (ICs). Control and measurement setup is designed on the basis of National Instruments module equipment PXI-4110, PXI-7841R and LabVIEW development environment. Block diagram of the developed system and software structure are depicted as well as test results for several ICs

Functional and Parametrical Control of Temperature Sensors with the NI MyRIO Module

Developed automated setup for functional and parametrical control of temperature sensors is presented. The hardware setup is based on the NI myRIO operated under LabVIEW software. Two ways of communication with the temperature sensor, advantages and disadvantages are described. The experimental results functional and parametrical control for three temperature sensors are presented

Functional and Parametrical Control of Temperature Sensors with the NI MyRIO Module

Developed automated setup for functional and parametrical control of temperature sensors is presented. The hardware setup is based on the NI myRIO operated under LabVIEW software. Two ways of communication with the temperature sensor, advantages and disadvantages are described. The experimental results functional and parametrical control for three temperature sensors are presented