Enhanced Aluminum Reflecting and Solar-Blind Filter Coatings for the Far-Ultraviolet

The advancement of far-ultraviolet (FUV) coatings is essential to meet the specified throughput requirements of the Large UV/Optical/IR (LUVOIR) Surveyor Observatory which will cover wavelengths down to the 100 nm range. The biggest constraint in the optical thin film coating design is attenuation in the Lyman-Alpha Ultraviolet range of 100-130 nm in which conventionally deposited thin film materials used in this spectral region (e.g. aluminum [Al] protected with Magnesium fluoride [MgF2]) often have high absorption and scatter properties degrading the throughput in an optical system. We investigate the use of optimally deposited aluminum and aluminum tri-fluoride (AlF3) materials for reflecting and solar blind band-pass filter coatings for use in the FUV. Optical characterization of the deposited designs has been performed using UV spectrometry. The optical thin film design and optimal deposition conditions to produce superior reflectance and transmittance using Al and AlF3 are presented

Weights of Linear Codes and their Dual

Codes were invented to detect and correct transmission errors caused by noise on a communication channel. In this talk, we will specifically look at linear codes as well as the dual code and the matrices that allow us to convert between the two. For linear codes, the error correcting capabilities of a code are determined by the weights, in particularly the minimum weight, of the codewords. We will discuss these weights and how to find their minimum value as well as introduce the MacWilliams Theorem, which connects the weights of a code to the weights of its dual

Phase Retrieval on Undersampled Data from the Thermal Infrared Sensor (TIRS)

Phase retrieval was applied to under-sampled data from a thermal infrared imaging system to estimate defocus across the field of view (FOV). We compare phase retrieval estimated values to those obtained using an independent technique

Broadband Achromatic Phase Shifter for a Nulling Interferometer

Nulling interferometry is a technique for imaging exoplanets in which light from the parent star is suppressed using destructive interference. Light from the star is divided into two beams and a phase shift of radians is introduced into one of the beams. When the beams are recombined, they destructively interfere to produce a deep null. For monochromatic light, this is implemented by introducing an optical path difference (OPD) between the two beams equal to lambda/2, where lambda is the wavelength of the light. For broadband light, however, a different phase shift will be introduced at each wavelength and the two beams will not effectively null when recombined. Various techniques have been devised to introduce an achromatic phase shift a phase shift that is uniform across a particular bandwidth. One popular technique is to use a series of dispersive elements to introduce a wavelength-dependent optical path in one or both of the arms of the interferometer. By intelligently choosing the number, material and thickness of a series of glass plates, a nearly uniform, arbitrary phase shift can be introduced between two arms of an interferometer. There are several constraints that make choosing the number, type, and thickness of materials a difficult problem, such as the size of the bandwidth to be nulled. Several solutions have been found for bandwidths on the order of 20 to 30 percent (Delta(lambda)/lambda(sub c)) in the mid-infrared region. However, uniform phase shifts over a larger bandwidth in the visible regime between 480 to 960 nm (67 percent) remain difficult to obtain at the tolerances necessary for exoplanet detection. A configuration of 10 dispersive glass plates was developed to be used as an achromatic phase shifter in nulling interferometry. Five glass plates were placed in each arm of the interferometer and an additional vacuum distance was also included in the second arm of the interferometer. This configuration creates a phase shift of pi radians with an average error of 5.97 x 10(exp -8) radians and standard deviation of 3.07 x 10(exp -4) radians. To reduce ghost reflections and interference effects from neighboring elements, the glass plates are tilted such that the beam does not strike each plate at normal incidence. Reflections will therefore walk out of the system and not contribute to the intensity when the beams are recombined. Tilting the glass plates, however, introduces several other problems that must be mitigated: (1) the polarization of a beam changes when refracted at an interface at non-normal incidence; (2) the beam experiences lateral chromatic spread as it traverses multiple glass plates; (3) at each surface, wavelength- dependent intensity losses will occur due to reflection. For a fixed angle of incidence, each of these effects must be balanced between each arm of the interferometer in order to ensure a deep null. The solution was found using a nonlinear optimization routine that minimized an objective function relating phase shift, intensity difference, chromatic beam spread, and polarization difference to the desired parameters: glass plate material and thickness. In addition to providing a uniform, broadband phase shift, the configuration achieves an average difference in intensity transmission between the two arms of the interferometer of 0.016 percent with a standard deviation of 3.64 x 10(exp -4) percent, an average difference in polarization between the two arms of the interferometer of 5.47 x 10(exp -5) percent with a standard deviation of 1.57 x 10(exp -6) percent, and an average chromatic beam shift between the two arms of the interferometer of -47.53 microns with a wavelength-by-wavelength spread of 0.389 microns

Approaches for Achieving Broadband Achromatic Phase Shifts for Visible Nulling Coronagraphy

Visible nulling coronagraphy is one of the few approaches to the direct detection and characterization of Jovian and Terrestrial exoplanets that works with segmented aperture telescopes. Jovian and Terrestrial planets require at least 10(exp -9) and 10(exp -10) image plane contrasts, respectively, within the spectral bandpass and thus require a nearly achromatic pi-phase difference between the arms of the interferometer. An achromatic pi-phase shift can be achieved by several techniques, including sequential angled thick glass plates of varying dispersive materials, distributed thin-film multilayer coatings, and techniques that leverage the polarization-dependent phase shift of total-internal reflections. Herein we describe two such techniques: sequential thick glass plates and Fresnel rhomb prisms. A viable technique must achieve the achromatic phase shift while simultaneously minimizing the intensity difference, chromatic beam spread and polarization variation between each arm. In this paper we describe the above techniques and report on efforts to design, model, fabricate, align the trades associated with each technique that will lead to an implementations of the most promising one in Goddard's Visible Nulling Coronagraph (VNC)

Phase Retrieval System for Assessing Diamond Turning and Optical Surface Defects

An optical design is presented for a measurement system used to assess the impact of surface errors originating from diamond turning artifacts. Diamond turning artifacts are common by-products of optical surface shaping using the diamond turning process (a diamond-tipped cutting tool used in a lathe configuration). Assessing and evaluating the errors imparted by diamond turning (including other surface errors attributed to optical manufacturing techniques) can be problematic and generally requires the use of an optical interferometer. Commercial interferometers can be expensive when compared to the simple optical setup developed here, which is used in combination with an image-based sensing technique (phase retrieval). Phase retrieval is a general term used in optics to describe the estimation of optical imperfections or aberrations. This turnkey system uses only image-based data and has minimal hardware requirements. The system is straightforward to set up, easy to align, and can provide nanometer accuracy on the measurement of optical surface defects