56 research outputs found

    Effects of treatment withdrawal on brachial and central aortic pressure after direct renin inhibition or angiotensin receptor blockade

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    Whilst sustained lowering of brachial systolic blood pressure (Br-SBP) and central aortic systolic pressure (CASP) have been demonstrated in patients with hypertension, effects of treatment withdrawal on these parameters have not been investigated. The ASSERTIVE study previously reported more sustained control of Br-SBP with aliskiren versus telmisartan in patients with hypertension, following 7-days treatment withdrawal. In this ASSERTIVE sub-study, we hypothesised that aliskiren would similarly exert more sustained control of CASP than telmisartan during treatment withdrawal

    Application of non-invasive central aortic pressure assessment in clinical trials: Clinical experience and value

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    Pressure measured with a cuff and sphygmomanometer in the brachial artery is accepted as an important predictor of future cardiovascular (CV) events. However, recent clinical evidence suggests that central aortic pressure (CAP) provides additional information for assessing CV risk than brachial blood pressure (BrBP). Central hemodynamics can now be non-invasively assessed with a number of devices, however, the methodology employed to measure CAP, in order to better identify the patients at higher CV risk in clinical practice, is still controversial. The purpose of this article is to review the technology behind the non-invasive measurement of CAP via the effects of different classes of antihypertensive drugs on CAP and the data supporting the predictive value of assessing CAP on clinical outcomes, and to foster the transfer of methodological knowledge from clinical trials into routine clinical practice

    Effects of exercise on central aortic pressure before and after treatment with renin-angiotensin system blockade in patients with hypertension.

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    Brachial blood pressure increases with exercise and an excessive rise predicts increased cardiovascular risk. Measurement of brachial blood pressure alone may exaggerate the true blood pressure elevation due to exercise-induced change to pressure amplification. Whether blood pressure-lowering treatment modulates pressure amplification during exercise is unknown

    Advances in fault modelling and test pattern generation for CMOS

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    ISBN: 0818607351MOS technology has specific fault mechanisms which induce specific behaviors when CMOS devices are considered. Stuck-on and stuck-open faults may convert a logical combinational network into an analog and sequential one. It is shown how to perform logic testing in the presence of these faults. Basic theorems for CMOS testing are derived

    Test device for a combinatorial logic circuit and integrated circuit including such a device

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    US4789821 (A1) ; JP62217170 (A) ; FR2592957 (A1) ; EP0229433 (B1)This device and method for testing a combinative logic circuit (4), includes on the one hand a circuit generating test sequences (30) for applying test logic signals to N inputs of the combinative logic circuit and, on the other hand, an output circuit (5) to analyze the output signals of the combinative logic circuit. These test sequences are successively applied to each of the N inputs (E1, E2, E3 and E4) so that an alternating series, at least twice, of logic "1"'s and of logic "0"'s while a word of N-1 bits is applied to the other inputs to ensure the transmission of the said alternating series to the output of the combinative logic circuit

    Testing CMOS: a challenge

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    ISSN: 0279-2834CMOS technology poses a multi-faceted challenge in testing. Since 1978, researchers have recognized that the stuck-open transistor fault requires special test procedures. Other faults, such as transistors stuck-on or shorted, likewise involve complications. However, these fault types have received comparatively little attention. This article reviews results on the testing of stuck-open faults, develops procedures for testing stuck-on faults, and discusses problems in testing for short faults. Through this analysis, the authors arrive at recommendations for investigating `design for CMOS testability'

    Origins of muons which stop underground

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