Testing CMOS: a challenge

Abstract

ISSN: 0279-2834CMOS technology poses a multi-faceted challenge in testing. Since 1978, researchers have recognized that the stuck-open transistor fault requires special test procedures. Other faults, such as transistors stuck-on or shorted, likewise involve complications. However, these fault types have received comparatively little attention. This article reviews results on the testing of stuck-open faults, develops procedures for testing stuck-on faults, and discusses problems in testing for short faults. Through this analysis, the authors arrive at recommendations for investigating `design for CMOS testability'