3 research outputs found

    Parameter analysis of pulsed eddy current sensor using principal component analysis

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    Pulsed eddy current (PEC) technique provides a means to inspect structures without surface contact. It is particularly useful when the structure’s surface is rough or inaccessible, such as insulated pipes in pipeline. Probe parameters of a PEC system, especially the sensing and excitation coil diameters, can significantly affect the PEC system’s performance. Thus, detailed analysis of these parameters is paramount in developing a PEC system. Currently, this is accomplished by establishing the trend of features with respect to the analyzed variables, e.g. sample thicknesses. However, prior to extracting these features, a number of configuration parameters have to be determined. For this reason, analyzing PEC performance over a range of coil diameter values is rather time-consuming as both the sensing and excitation coil diameters significantly affect the received signals. Principal component analysis (PCA) is proposed as an alternative to the feature extraction. The work here analyzes the trends contributed by the PCA scores for different values of sensing and excitation coil parameters. Results from both numerical simulations and experiments suggest that the sensitivity of the PEC probe is highly correlated with the excitation coil diameter, while the excitation-sensing coil distance is not significant in determining the sensitivity of the PEC probe. These findings are consistent with those reported in the literature, suggesting the potential of adopting PCA for an automated PEC performance analysis process

    Flexible X-ray imaging detectors using scintillating fibers

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    We present early design and simulation work on a novel X-ray imaging detector. The intent of the FleX-RAY project is to create a digital X-ray detector that is capable of producing high-resolution images, is flexible enough to produce an image on a curved surface, and is capable of self-reporting its final shape. The X-rays will be detected on a sheet of scintillating optical fibers, which will guide the scintillation light to single-photon avalanche photodiodes. This setup allows the electronics and hardware to be moved out of the path of the X-ray beam, limiting the need for additional shielding. Self-shape-reporting will be achieved using a flexible ultra-thin glass substrate with optical waveguides and Bragg gratings, processed by femtosecond laser point-by-point writing. The functionalized glass substrate allows precise measurement of strains, which can be used to calculate the shape
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