BIAS IN ADC TERMINAL BASED GAIN AND OFFSET ESTIMATION USING THE HISTOGRAM METHOD

Abstract − It is demonstrated that, when using the Histogram Test Method to test an analogue to digital converter, the presence of additive noise in the test setup or in the converter itself causes a bias in the terminal based estimation of the gain but not in the estimation of the offset. This will be demonstrated here by analytically determining the estimation error as a function of the sinusoidal stimulus signal amplitude and the noise standard deviation. A closed form approximate expression will be proposed for the computation of the bias of terminal based gain. The results presented are numerically validated using a Monte Carlo procedure

Study of the Variance in the Histogram Test of ADCs

In this paper an overview of the uncertainty in the results obtained with the histogram test of Analog to Digital Converters is presented. The effect of phase noise, input equivalent additive noise and random phase difference on the number of counts of the cumulative histogram is shown. Theoretical and experimental results are presented. I