BIAS IN ADC TERMINAL BASED GAIN AND OFFSET ESTIMATION USING THE HISTOGRAM METHOD

Abstract

Abstract − It is demonstrated that, when using the Histogram Test Method to test an analogue to digital converter, the presence of additive noise in the test setup or in the converter itself causes a bias in the terminal based estimation of the gain but not in the estimation of the offset. This will be demonstrated here by analytically determining the estimation error as a function of the sinusoidal stimulus signal amplitude and the noise standard deviation. A closed form approximate expression will be proposed for the computation of the bias of terminal based gain. The results presented are numerically validated using a Monte Carlo procedure