Properties of Electrodeposited CuSCN 2D Layers and Nanowires Influenced by Their Mixed Domain Structure

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Thickness dependent electrical and optical properties of nanocrystalline copper sulphide thin films grown by simple chemical route

657-660A Novel chemical bath deposition (CBD) method has been developed to deposit semiconducting nanocrystalline copper sulphide (Cu2S) thin films on ordinary glass substrates with different thicknesses. The deposition bath consists of aqueous copper chloride (CuCl2), ammonia (NH3) and thiourea [SC(NH2)2]. It is found that the deposition parameters significantly influence the quality and the thickness of Cu2S films. The films were uniform and adherent to glass substrates. The deposited films have been characterized by X-ray diffraction (XRD), Scanning electron microscope (SEM), optical absorption and electrical resistivity. The effect of film thickness on the optical, structural and electrical properties has been studied. The shift of 0.46 eV in the optical band gap energy (Eg) and decrease in electrical resistivity from 6.463 10<span style="font-family:Symbol; mso-ascii-font-family:" times="" new="" roman";mso-hansi-font-family:"times="" roman";="" mso-char-type:symbol;mso-symbol-font-family:symbol"="" lang="EN-GB">-2 to 8.973 <span style="font-family:Symbol; mso-ascii-font-family:" times="" new="" roman";mso-hansi-font-family:"times="" roman";="" mso-char-type:symbol;mso-symbol-font-family:symbol"="" lang="EN-GB"> 10-3 Ω-cm and increase in the grain size of Cu2S crystallites from 30 to 250 nm were observed when the film thickness was varied from 130 to 250 nm. </span

Studies on nanocrystalline ZnS thin films prepared by modified chemical bath deposition method

765-768Nanocrystalline zinc sulphide (ZnS) thin films have been grown on glass surface by modified chemical bath deposition method (M-CBD). The optimized preparative parameters including temperature, pH of solution, immersion time, immersion cycles, have been optimized for fine nanocrystalline film growth. As deposited nanocrystalline zinc sulphide (ZnS) thin films have been characterized for the structural, optical and electrical properties using X-ray diffraction (XRD), UV-Vis spectra and dc electrical conductivity by two point probe method