6 research outputs found
Comparative study of auxetic geometrics by means of computer-aided design and engineering
Auxetic materials (or metamaterials) are those with a negative Poisson ratio (NPR) and display the unexpected property of lateral expansion when stretched, as well as an equal and opposing densification when compressed. Such geometries are being progressively employed in the development of novel products, especially in the fields of intelligent expandable actuators, shape morphing structures and minimally invasive implantable devices. Although several auxetic and potentially auxetic geometries have been summarized in previous reviews and research, precise information regarding relevant properties for design tasks is not always provided.
In this study we present a comparative study of two-dimensional and three-dimensional auxetic geometries carried out by means of computer-aided design and engineering tools (from now on CAD–CAE). The first part of the study is focused on the development of a CAD library of auxetics. Once the library is developed we simulate the behavior of the different auxetic geometries and elaborate a systematic comparison, considering relevant properties of these geometries, such as Poisson ratio(s), maximum volume or area reductions attainable and equivalent Young's modulus, hoping it may provide useful information for future designs of devices based on these interesting structures
Growth regimes of porous gold thin films deposited by magnetron sputtering at oblique incidence: from compact to columnar microstructures
Growth regimes of gold thin films deposited by magnetron sputtering at oblique angles and low temperatures are studied from both theoretical and experimental points of view. Thin films were deposited in a broad range of experimental conditions by varying the substrate tilt angle and background pressure, and were analyzed by Field Emission Scanning Electron Microscopy (FESEM) and Grazing Incidence Small-Angle X-ray Scattering (GISAXS) techniques. Results indicate that the morphological features of the films strongly depend on the experimental conditions, but can be categorized within four generic microstructures, each of them defined by different bulk geometrical patterns and pore percolation depth and connectivity. With the help of a growth model, a microstructure phase diagram has been constructed where the main features of the films are depicted as a function of experimentally controllable quantities, finding a good agreement with the experimental results in all the studied cases.Junta de Andalucía P09-CTS- 5189, TEP5283, P10-FQM-6900Comunidad de Madríd S2009/MAT–1726Ministerio de Economía y Competitividad MAT2011-29194-C02-01, CSD2008-00023, MAT2008-06652, MAT2010-21228, MAT2010-1844
Influence of plasma-generated negative oxygen ion impingement on magnetron sputtered amorphous SiO2 thin films during growth at low temperatures
Growth of amorphous SiO2 thin films deposited by reactive magnetron sputtering at low temperatures
has been studied under different oxygen partial pressure conditions. Film microstructures varied from
coalescent vertical column-like to homogeneous compact microstructures, possessing all similar
refractive indexes. A discussion on the process responsible for the different microstructures is carried
out focusing on the influence of (i) the surface shadowing mechanism, (ii) the positive ion
impingement on the film, and (iii) the negative ion impingement. We conclude that only the trend
followed by the latter and, in particular, the impingement of O- ions with kinetic energies between 20
and 200 eV, agrees with the resulting microstructural changes. Overall, it is also demonstrated that
there are two main microstructuring regimes in the growth of amorphous SiO2 thin films by
magnetron sputtering at low temperatures, controlled by the amount of O2 in the deposition reactor,
which stem from the competition between surface shadowing and ion-induced adatom surface
mobilityMinisterio de Innovación español-MAT 2007-65764Ministerio de Innovación español (CONSOLIDER INGENIO 2010)-CSD2008-00023Junta de Andalucía-TEP2275, TEP5283, P07-FQM-03298 y P10-FQM-690
Growth of silver on ZnO and SnO2 thin films intended for low emissivity applications
In the present work we have investigated the relationships existing between the optical properties and the growth mechanism, microstructure and surface roughness of SnO2 and ZnO oxide films prepared by magnetron sputtering under conditions resembling those utilized in industry. Thin films of these oxides with different thicknesses were characterized by atomic force microscopy, glancing incidence X-ray diffraction (GIXRD), X-ray reflectometry and spectroscopic ellipsometry. The roughness evolution of the film properties (density, surface roughness and refraction index) as a function of their thickness has been evaluated within the concepts of the Dynamic Scaling Theory of thin film growth. Zinc oxide films were rougher than tin oxide films of similar thickness, indicating a different growing mechanism for the two materials. Silver was evaporated onto the surface of the two oxide thin films and its earlier stages of nucleation studied by background analysis of the X-ray photoemission spectra. A different nucleation mechanism was found depending on the nature of the oxide acting as substrate. The superior performance of the zinc oxide based low emissive coatings is related with a better wetting of silver on the surface of this oxide despite the comparatively lower roughness of the tin oxide layers. © 2013 Elsevier B.V.Peer Reviewe
Growth regimes of porous gold thin films deposited by magnetron sputtering at oblique incidence: from compact to columnar microstructures
Growth regimes of gold thin films deposited by magnetron sputtering at oblique angles and low temperatures are studied from both theoretical and experimental points of view. Thin films were deposited in a broad range of experimental conditions by varying the substrate tilt angle and background pressure, and were analyzed by Field Emission Scanning Electron Microscopy (FESEM) and Grazing Incidence Small-Angle X-ray Scattering (GISAXS) techniques. Results indicate that the morphological features of the films strongly depend on the experimental conditions, but can be categorized within four generic microstructures, each of them defined by different bulk geometrical patterns and pore percolation depth and connectivity. With the help of a growth model, a microstructure phase diagram has been constructed where the main features of the films are depicted as a function of experimentally controllable quantities, finding a good agreement with the experimental results in all the studied cases.We thank the Junta de Andalucía (projects P09-CTS- 5189, TEP5283 and P10-FQM-6900), the Comunidad de Madrid (S2009/MAT–1726) and the Ministry of Economy and Competitiveness (projects MAT2011-29194-C02-01, CONSOLIDER CSD2008-00023, MAT2008-06652, MAT2010-21228, and MAT2010-18447) for financial support.Peer Reviewe