Detection mechanism for ferroelectric domain boundaries with lateral force microscopy

The contrast mechanism for the visualization of ferroelectric domain boundaries with lateral force microscopy is generally assumed to be caused by mechanical deformation of the sample due to the converse piezoelectric effect. We show, however, that electrostatic interactions between the charged tip and the electric fields arising from the surface polarization charges dominate the contrast mechanism. This explanation is sustained by quantitative analysis of the measured forces as well as by comparative measurements on different materials

Electrostatic topology of ferroelectric domains in YMnO3_3

Trimerization-polarization domains in ferroelectric hexagonal YMnO$_3$ were resolved in all three spatial dimensions by piezoresponse force microscopy. Their topology is dominated by electrostatic effects with a range of 100 unit cells and reflects the unusual electrostatic origin of the spontaneous polarization. The response of the domains to locally applied electric fields explains difficulties in transferring YMnO$_3$ into a single-domain state. Our results demonstrate that the wealth of non-displacive mechanisms driving ferroelectricity that emerged from the research on multiferroics are a rich source of alternative types of domains and domain-switching phenomena

Lateral Signals in Piezoresponse Force Microscopy at Domain Boundaries of Ferroelectric Crystals

In piezoresponse force microscopy a lateral signal at the domain boundaries is occasionally observed. In recent years, a couple of experiments have been reported and varying explanations for the origin of this lateral signal have been proposed. Additionally, elaborated theoretical modeling for this particular issue has been carried out. Here we present experimental data obtained on different crystallographic cuts of $\rm LiNbO_3$, $\rm BaTiO_3$, and $\rm KTiOPO_4$ single crystals. We could thereby rule out some of the explanations proposed so far, introduce another possible mechanism, and quantitatively compare our results to the existing modeling

Impact of elasticity on the piezoresponse of adjacent ferroelectric domains investigated by scanning force microscopy

As a consequence of elasticity, mechanical deformations of crystals occur on a length scale comparable to their thickness. This is exemplified by applying a homogeneous electric field to a multi-domain ferroelectric crystal: as one domain is expanding the adjacent ones are contracting, leading to clamping at the domain boundaries. The piezomechanically driven surface corrugation of micron-sized domain patterns in thick crystals using large-area top electrodes is thus drastically suppressed, barely accessible by means of piezoresponse force microscopy

Depth resolution of Piezoresponse force microscopy

Given that a ferroelectric domain is generally a three dimensional entity, the determination of its area as well as its depth is mandatory for full characterization. Piezoresponse force microscopy (PFM) is known for its ability to map the lateral dimensions of ferroelectric domains with high accuracy. However, no depth profile information has been readily available so far. Here, we have used ferroelectric domains of known depth profile to determine the dependence of the PFM response on the depth of the domain, and thus effectively the depth resolution of PFM detection

Contrast Mechanisms for the Detection of Ferroelectric Domains with Scanning Force Microscopy

We present a full analysis of the contrast mechanisms for the detection of ferroelectric domains on all faces of bulk single crystals using scanning force microscopy exemplified on hexagonally poled lithium niobate. The domain contrast can be attributed to three different mechanisms: i) the thickness change of the sample due to an out-of-plane piezoelectric response (standard piezoresponse force microscopy), ii) the lateral displacement of the sample surface due to an in-plane piezoresponse, and iii) the electrostatic tip-sample interaction at the domain boundaries caused by surface charges on the crystallographic y- and z-faces. A careful analysis of the movement of the cantilever with respect to its orientation relative to the crystallographic axes of the sample allows a clear attribution of the observed domain contrast to the driving forces respectively.Comment: 8 pages, 8 figure