214,627 research outputs found
Crosstalk Correction in Atomic Force Microscopy
Commercial atomic force microscopes usually use a four-segmented photodiode
to detect the motion of the cantilever via laser beam deflection. This read-out
technique enables to measure bending and torsion of the cantilever separately.
A slight angle between the orientation of the photodiode and the plane of the
readout beam, however, causes false signals in both readout channels, so-called
crosstalk, that may lead to misinterpretation of the acquired data. We
demonstrate this fault with images recorded in contact mode on ferroelectric
crystals and present an electronic circuit to compensate for it, thereby
enabling crosstalk-free imaging
Atomic Force Microscopy
The goal of this experiment is to use the Atomic Force Microscope (AFM) to get images of selected items and determine some distances of the characteristics of each sample. The ultimate goal is to measure the length of a nanotube, but unfortunately there were none left on the slide that was supposed to contain them. From the results of the lab and the lab manual of “companies” with possible lengths for each sample, Lindaas-Lahti Industries seems to have the best fit overall
Phase imaging with intermodulation atomic force microscopy
Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic
force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever
in close proximity to a surface experiences the nonlinear tip-sample force
which mixes the drive tones and generates new frequency components in the
cantilever response known as intermodulation products (IMPs). We present a
procedure for extracting the phase at each IMP and demonstrate phase images
made by recording this phase while scanning. Amplitude and phase images at
intermodulation frequencies exhibit enhanced topographic and material contrast.Comment: 6 pages, 6 page
Sensing Noncollinear Magnetism at the Atomic Scale Combining Magnetic Exchange and Spin-Polarized Imaging
Storing and accessing information in atomic-scale magnets requires magnetic
imaging techniques with single-atom resolution. Here, we show simultaneous
detection of the spin-polarization and exchange force, with or without the flow
of current, with a new method, which combines scanning tunneling microscopy and
non-contact atomic force microscopy. To demonstrate the application of this new
method, we characterize the prototypical nano-skyrmion lattice formed on a
monolayer of Fe/Ir(111). We resolve the square magnetic lattice by employing
magnetic exchange force microscopy, demonstrating its applicability to
non-collinear magnetic structures, for the first time. Utilizing
distance-dependent force and current spectroscopy, we quantify the exchange
forces in comparison to the spin-polarization. For strongly spin-polarized
tips, we distinguish different signs of the exchange force which we suggest
arises from a change in exchange mechanisms between the probe and a skyrmion.
This new approach may enable both non-perturbative readout combined with
writing by current-driven reversal of atomic-scale magnets
- …