214,627 research outputs found

    Crosstalk Correction in Atomic Force Microscopy

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    Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to measure bending and torsion of the cantilever separately. A slight angle between the orientation of the photodiode and the plane of the readout beam, however, causes false signals in both readout channels, so-called crosstalk, that may lead to misinterpretation of the acquired data. We demonstrate this fault with images recorded in contact mode on ferroelectric crystals and present an electronic circuit to compensate for it, thereby enabling crosstalk-free imaging

    Atomic Force Microscopy

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    The goal of this experiment is to use the Atomic Force Microscope (AFM) to get images of selected items and determine some distances of the characteristics of each sample. The ultimate goal is to measure the length of a nanotube, but unfortunately there were none left on the slide that was supposed to contain them. From the results of the lab and the lab manual of “companies” with possible lengths for each sample, Lindaas-Lahti Industries seems to have the best fit overall

    Phase imaging with intermodulation atomic force microscopy

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    Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which mixes the drive tones and generates new frequency components in the cantilever response known as intermodulation products (IMPs). We present a procedure for extracting the phase at each IMP and demonstrate phase images made by recording this phase while scanning. Amplitude and phase images at intermodulation frequencies exhibit enhanced topographic and material contrast.Comment: 6 pages, 6 page

    Sensing Noncollinear Magnetism at the Atomic Scale Combining Magnetic Exchange and Spin-Polarized Imaging

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    Storing and accessing information in atomic-scale magnets requires magnetic imaging techniques with single-atom resolution. Here, we show simultaneous detection of the spin-polarization and exchange force, with or without the flow of current, with a new method, which combines scanning tunneling microscopy and non-contact atomic force microscopy. To demonstrate the application of this new method, we characterize the prototypical nano-skyrmion lattice formed on a monolayer of Fe/Ir(111). We resolve the square magnetic lattice by employing magnetic exchange force microscopy, demonstrating its applicability to non-collinear magnetic structures, for the first time. Utilizing distance-dependent force and current spectroscopy, we quantify the exchange forces in comparison to the spin-polarization. For strongly spin-polarized tips, we distinguish different signs of the exchange force which we suggest arises from a change in exchange mechanisms between the probe and a skyrmion. This new approach may enable both non-perturbative readout combined with writing by current-driven reversal of atomic-scale magnets

    Atomic Force Microscopy

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