Crosstalk Correction in Atomic Force Microscopy

Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to measure bending and torsion of the cantilever separately. A slight angle between the orientation of the photodiode and the plane of the readout beam, however, causes false signals in both readout channels, so-called crosstalk, that may lead to misinterpretation of the acquired data. We demonstrate this fault with images recorded in contact mode on ferroelectric crystals and present an electronic circuit to compensate for it, thereby enabling crosstalk-free imaging

Atomic Force Microscopy

The goal of this experiment is to use the Atomic Force Microscope (AFM) to get images of selected items and determine some distances of the characteristics of each sample. The ultimate goal is to measure the length of a nanotube, but unfortunately there were none left on the slide that was supposed to contain them. From the results of the lab and the lab manual of “companies” with possible lengths for each sample, Lindaas-Lahti Industries seems to have the best fit overall

Phase imaging with intermodulation atomic force microscopy

Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which mixes the drive tones and generates new frequency components in the cantilever response known as intermodulation products (IMPs). We present a procedure for extracting the phase at each IMP and demonstrate phase images made by recording this phase while scanning. Amplitude and phase images at intermodulation frequencies exhibit enhanced topographic and material contrast.Comment: 6 pages, 6 page

Atomic Force Microscopy

The goal of this experiment is to use the Atomic Force Microscope (AFM) to get images of selected items and determine some distances of the characteristics of each sample. The ultimate goal is to measure the length of a nanotube, but unfortunately there were none left on the slide that was supposed to contain them. From the results of the lab and the lab manual of “companies” with possible lengths for each sample, Lindaas-Lahti Industries seems to have the best fit overall

Electron scattering in atomic force microscopy experiments

It has been shown that electron transitions, as measured in a scanning tunnelling microscope (STM), are related to chemical interactions in a tunnelling barrier. Here, we show that the shape and apparent height of subatomic features in an atomic force microscopy (AFM) experiment on Si(111) depend directly on the available electron states of the silicon surface and the silicon AFM tip. Simulations and experiments confirm that forces and currents show similar subatomic variations for tip-sample distances approaching the bulk bonding length.Comment: 5 pages and 4 figure