Analyzing the Resilience of Convolutional Neural Networks Implemented on GPUs: Alexnet as a Case Study

There have been an extensive use of Convolutional Neural Networks (CNNs) in healthcare applications. Presently, GPUs are the most prominent and dominated DNN accelerators to increase the execution speed of CNN algorithms to improve their performance as well as the Latency. However, GPUs are prone to soft errors. These errors can impact the behaviors of the GPU dramatically. Thus, the generated fault may corrupt data values or logic operations and cause errors, such as Silent Data Corruption. unfortunately, soft errors propagate from the physical level (microarchitecture) to the application level (CNN model). This paper analyzes the reliability of the AlexNet model based on two metrics: (1) critical kernel vulnerability (CKV) used to identify the malfunction and light- malfunction errors in each kernel, and (2) critical layer vulnerability (CLV) used to track the malfunction and light-malfunction errors through layers. To achieve this, we injected the AlexNet which was popularly used in healthcare applications on NVIDIA’s GPU, using the SASSIFI fault injector as the major evaluator tool. The experiments demonstrate through the average error percentage that caused malfunction of the models has been reduced from 3.7% to 0.383% by hardening only the vulnerable part with the overhead only 0.2923%. This is a high improvement in the model reliability for healthcare applications

Development of low-overhead soft error mitigation technique for safety critical neural networks applications

Deep Neural Networks (DNNs) have been widely applied in healthcare applications. DNN-based healthcare applications are safety-critical systems that require highreliability implementation due to a high risk of human death or injury in case of malfunction. Several DNN accelerators are used to execute these DNN models, and GPUs are currently the most prominent and the dominated DNN accelerators. However, GPUs are prone to soft errors that dramatically impact the GPU behaviors; such error may corrupt data values or logic operations, which result in Silent Data Corruption (SDC). The SDC propagates from the physical level to the application level (SDC that occurs in hardware GPUs’ components) results in misclassification of objects in DNN models, leading to disastrous consequences. Food and Drug Administration (FDA) reported that 1078 of the adverse events (10.1%) were unintended errors (i.e., soft errors) encountered, including 52 injuries and two deaths. Several traditional techniques have been proposed to protect electronic devices from soft errors by replicating the DNN models. However, these techniques cause significant overheads of area, performance, and energy, making them challenging to implement in healthcare systems that have strict deadlines. To address this issue, this study developed a Selective Mitigation Technique based on the standard Triple Modular Redundancy (S-MTTM-R) to determine the model’s vulnerable parts, distinguishing Malfunction and Light-Malfunction errors. A comprehensive vulnerability analysis was performed using a SASSIFI fault injector at the CNN AlexNet and DenseNet201 models: layers, kernels, and instructions to show both models’ resilience and identify the most vulnerable portions and harden them by injecting them while implemented on NVIDIA’s GPUs. The experimental results showed that S-MTTM-R achieved a significant improvement in error masking. No-Malfunction have been improved from 54.90%, 67.85%, and 59.36% to 62.80%, 82.10%, and 80.76% in the three modes RF, IOA, and IOV, respectively for AlexNet. For DenseNet, NoMalfunction have been improved from 43.70%, 67.70%, and 54.68% to 59.90%, 84.75%, and 83.07% in the three modes RF, IOA, and IOV, respectively. Importantly, S-MTTMR decreased the percentage of errors that case misclassification (Malfunction) from 3.70% to 0.38% and 5.23% to 0.23%, for AlexNet and DenseNet, respectively. The performance analysis results showed that the S-MTTM-R achieved lower overhead compared to the well-known protection techniques: Algorithm-Based Fault Tolerance (ABFT), Double Modular Redundancy (DMR), and Triple Modular Redundancy (TMR). In light of these results, the study revealed strong evidence that the developed S-MTTMR was successfully mitigated the soft errors for the DNNs model on GPUs with lowoverheads in energy, performance, and area indicated a remarkable improvement in the healthcare domains’ model reliability

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems