Patterns of Participation and Motivation in Folding@home: The Contribution of Hardware Enthusiasts and Overclockers

Folding@home is a distributed computing project in which participants run protein folding simulations on their computers. Participants complete work units and are awarded points for their contribution. An investigation into motivations to participate and patterns of participation revealed the significant contribution of a sub-community composed of individuals who custom-build computers to maximise their processing power. These individuals, known as “overclockers” or “hardware enthusiasts,” use distributed computing projects such as Folding@home to benchmark their modified computers and to compete with one another to see who can process the greatest number of project work units. Many are initially drawn to the project to learn about computer hardware from other overclockers and to compete for points. However, once they learn more about the scientific outputs of Folding@home, some participants become more motivated by the desire to contribute to scientific research. Overclockers form numerous online communities where members collaborate and help each other maximise their computing output. They invest heavily in their computers and process the majority of Folding@home’s simulations, thus providing an invaluable (and free) resource

Optimizing Electrical Efficiency and Thermal Performance of AMD Ryzen 3 2200G Processor through Undervolting in Synthetic Benchmarks and Gaming Scenarios

Undervolt is a term that refers to a way to make a computer device run on lower electrical power than the manufacturer's provisions. To do undervolting requires a good experience for user and computer devices that are good or specialized for undervolt purposes such as processors. This study aims to find the optimal minimum voltage that the processor can use without causing performance degradation or instability, and temperature drops that the processor produces while it is running. In this study, the author tested a processor device with the type of AMD Ryzen that already supports the undervolting process from the factory. AMD Ryzen 3 2200G processor is one of the processors with 14nm fabrication, where this processor promises significant performance with the number of cores, memory chace capacity, and power efficiency. On this day, many games demand the use of an aggressive processor. Of course, this will consume power on a larger processor. The author conducted several test scenarios to get the best performance. It was found that the scenario with undervolt at 1.25V showed the best performance

Analysis and comparison of processor testing software

U ovom završnom radu testirana je stabilnost procesora na dva različita prijenosna računala korištenjem nekoliko programskih alata. Svaki test trajao je 240 minuta što je minimalno vrijeme u kojem je moguće uočiti do koje mjere će neki računalni sustav biti opterećen. U radu su objašnjeni parametri procesora koji najviše utječu na njegove performanse. Na kraju rada uspoređeni su konačni rezultati opterećenja procesora. Kod oba prijenosna računala program Prime 95 imao je najviše utjecaja na opterećenje procesora.In this thesis, processor stability was tested on two different laptops using several software tools. Each test lasted for 240 minutes, which is the minimum time which is needed to see the end results of stress testing the CPU. This thesis also describes parameters which affect the performance of processors the most. Finally, the final results of the processors stress tests are shown. For both notebooks, Prime 95 had the most impact on the processor load

Post-silicon failing-test generation through evolutionary computation

The incessant progress in manufacturing technology is posing new challenges to microprocessor designers. Several activities that were originally supposed to be part of the pre-silicon design phase are migrating after tape-out, when the first silicon prototypes are available. The paper describes a post-silicon methodology for devising functional failing tests. Therefore, suited to be exploited by microprocessor producer to detect, analyze and debug speed paths during verification, speed-stepping, or other critical activities. The proposed methodology is based on an evolutionary algorithm and exploits a versatile toolkit named µGP. The paper describes how to take into account complex hardware characteristics and architectural details of such complex devices. The experimental evaluation clearly demonstrates the potential of this line of researc

Timing speculation and adaptive reliable overclocking techniques for aggressive computer systems

Computers have changed our lives beyond our own imagination in the past several decades. The continued and progressive advancements in VLSI technology and numerous micro-architectural innovations have played a key role in the design of spectacular low-cost high performance computing systems that have become omnipresent in today\u27s technology driven world. Performance and dependability have become key concerns as these ubiquitous computing machines continue to drive our everyday life. Every application has unique demands, as they run in diverse operating environments. Dependable, aggressive and adaptive systems improve efficiency in terms of speed, reliability and energy consumption. Traditional computing systems run at a fixed clock frequency, which is determined by taking into account the worst-case timing paths, operating conditions, and process variations. Timing speculation based reliable overclocking advocates going beyond worst-case limits to achieve best performance while not avoiding, but detecting and correcting a modest number of timing errors. The success of this design methodology relies on the fact that timing critical paths are rarely exercised in a design, and typical execution happens much faster than the timing requirements dictated by worst-case design methodology. Better-than-worst-case design methodology is advocated by several recent research pursuits, which exploit dependability techniques to enhance computer system performance. In this dissertation, we address different aspects of timing speculation based adaptive reliable overclocking schemes, and evaluate their role in the design of low-cost, high performance, energy efficient and dependable systems. We visualize various control knobs in the design that can be favorably controlled to ensure different design targets. As part of this research, we extend the SPRIT3E, or Superscalar PeRformance Improvement Through Tolerating Timing Errors, framework, and characterize the extent of application dependent performance acceleration achievable in superscalar processors by scrutinizing the various parameters that impact the operation beyond worst-case limits. We study the limitations imposed by short-path constraints on our technique, and present ways to exploit them to maximize performance gains. We analyze the sensitivity of our technique\u27s adaptiveness by exploring the necessary hardware requirements for dynamic overclocking schemes. Experimental analysis based on SPEC2000 benchmarks running on a SimpleScalar Alpha processor simulator, augmented with error rate data obtained from hardware simulations of a superscalar processor, are presented. Even though reliable overclocking guarantees functional correctness, it leads to higher power consumption. As a consequence, reliable overclocking without considering on-chip temperatures will bring down the lifetime reliability of the chip. In this thesis, we analyze how reliable overclocking impacts the on-chip temperature of a microprocessor and evaluate the effects of overheating, due to such reliable dynamic frequency tuning mechanisms, on the lifetime reliability of these systems. We then evaluate the effect of performing thermal throttling, a technique that clamps the on-chip temperature below a predefined value, on system performance and reliability. Our study shows that a reliably overclocked system with dynamic thermal management achieves 25% performance improvement, while lasting for 14 years when being operated within 353K. Over the past five decades, technology scaling, as predicted by Moore\u27s law, has been the bedrock of semiconductor technology evolution. The continued downscaling of CMOS technology to deep sub-micron gate lengths has been the primary reason for its dominance in today\u27s omnipresent silicon microchips. Even as the transition to the next technology node is indispensable, the initial cost and time associated in doing so presents a non-level playing field for the competitors in the semiconductor business. As part of this thesis, we evaluate the capability of speculative reliable overclocking mechanisms to maximize performance at a given technology level. We evaluate its competitiveness when compared to technology scaling, in terms of performance, power consumption, energy and energy delay product. We present a comprehensive comparison for integer and floating point SPEC2000 benchmarks running on a simulated Alpha processor at three different technology nodes in normal and enhanced modes. Our results suggest that adopting reliable overclocking strategies will help skip a technology node altogether, or be competitive in the market, while porting to the next technology node. Reliability has become a serious concern as systems embrace nanometer technologies. In this dissertation, we propose a novel fault tolerant aggressive system that combines soft error protection and timing error tolerance. We replicate both the pipeline registers and the pipeline stage combinational logic. The replicated logic receives its inputs from the primary pipeline registers while writing its output to the replicated pipeline registers. The organization of redundancy in the proposed Conjoined Pipeline system supports overclocking, provides concurrent error detection and recovery capability for soft errors, intermittent faults and timing errors, and flags permanent silicon defects. The fast recovery process requires no checkpointing and takes three cycles. Back annotated post-layout gate-level timing simulations, using 45nm technology, of a conjoined two-stage arithmetic pipeline and a conjoined five-stage DLX pipeline processor, with forwarding logic, show that our approach, even under a severe fault injection campaign, achieves near 100% fault coverage and an average performance improvement of about 20%, when dynamically overclocked

Conjoined Processor: A Fault Tolerant High Performance Microprocessor

Reliability has become a serious concern as systems embrace nanometer technologies. Current reliability enhancement techniques cause slowdown in processor operation. In this work, we propose a novel approach that organizes redundancy in a special way to provide high degree of fault tolerance. Our approach improves performance by reliably adapting the system clock frequency during run time, based on the current running application and environmental conditions. The organization of redundancy in the proposed conjoined processor supports overclocking, provides concurrent error detection and recovery capability for soft errors, timing errors, intermittent faults and detects silicon defects. The fast recovery process requires no checkpointing and takes three cycles. Post-layout timing annotated gate level simulations of a conjoined two stage arithmetic pipeline shows that our approach achieves near 100% fault coverage, and a performance improvement of 21%. A five stage in-order conjoined pipeline processor was designed and implemented to verify correctness of the proposed architecture

RAKSHA:Reliable and Aggressive frameworK for System design using High-integrity Approaches

Advances in the fabrication technology have been a major driving force in the unprecedented increase in computing capabilities over the last several decades. Despite huge reductions in the switching energy of the transistors, two major issues have emerged with decreasing fabrication technology scales. They are: 1) increased impact of process, voltage, and temperature (PVT) variation on transistor performance, and 2) increased susceptibility of transistors to soft errors induced by high energy particles. In presence of PVT variation, as transistor sizes continue to decrease, the design margins used to guarantee correct operation in the presence of worst-case scenarios have been increasing. Systems run at a clock frequency, which is determined by accounting the worst-case timing paths, operating conditions, and process variations. Timing speculation based reliable and aggressive clocking advocates going beyond worst-case limits to achieve best performance while not avoiding, but detecting and correcting a modest number of timing errors. Such design methodology exploits the fact that timing critical paths are rarely exercised in a design, and typical execution happens much faster than the timing requirements dictated by worst-case scenarios. Better-than-worst-case design methodology is advocated by several recent research pursuits, which propose to exploit in-built fault tolerance mechanisms to enhance computer system performance. Recent works have also shown that the performance lose due to over provisioning base on worst-case design margins is upward of 20\% in terms operating frequency and upward of 50\% in terms of power efficiency. The threat of soft error induced system failure in computing systems has become more prominent as we adopt ultra-deep submicron process technologies. With respect to soft error susceptibility, decreasing transistor geometries lower the energy threshold needed by high-energy particles to induce errors. As this trend continues, the need for fault tolerance mechanisms to counteract this effect has moved from a nice to have, to be a requirement in current and future systems. In this dissertation, RAKSHA (meaning to protect and save in Sanskrit), we take a multidimensional look at the challenges of system design built with scaled-technologies using high integrity techniques. In RAKSHA, to mitigate soft errors, we propose lightweight high-integrity mechanisms as basic system building blocks which allow system to offer performance levels comparable to a non-fault tolerant system. In addition, we also propose to effectively exploit and use the availability of fault tolerant mechanisms to allow and tolerate data-dependent failures, thus setting systems to operate at typical case circuit delays and enhance system performance. We also propose the use of novel high-integrity cells for increasing system energy efficiency and also potentially increasing system security by combating power-analysis-based side channel attacks. Such an approach allows balancing of performance, power, and security with no further overhead over the resources needed to incorporate fault tolerance. Using our framework, instead of designing circuits to meet worst-case requirements, circuits can be designed to meet typical-case requirements. In RAKSHA, we propose two efficient soft error mitigation schemes, namely Soft Error Mitigation (SEM) and Soft and Timing Error Mitigation (STEM), using the approach of multiple clocking of data for protecting combinational logic blocks from soft errors. Our first technique, SEM, based on distributed and temporal voting of three registers, unloads the soft error detection overhead from the critical path of the systems. SEM is also capable of ignoring false errors and recovers from soft errors using in-situ fast recovery avoiding recomputation. Our second technique, STEM, while tolerating soft errors, adds timing error detection capability to guarantee reliable execution in aggressively clocked designs that enhance system performance by operating beyond worst-case clock frequency. We also present a specialized low overhead clock phase management scheme that ably supports our proposed techniques. Timing annotated gate level simulations, using 45nm libraries, of a pipelined adder-multiplier and DLX processor show that both our techniques achieve near 100% fault coverage. For DLX processor, even under severe fault injection campaigns, SEM achieves an average performance improvement of 26.58% over a conventional triple modular redundancy voter based soft error mitigation scheme, while STEM outperforms SEM by 27.42%. We refer to systems built with SEM and STEM cells as reliable and aggressive systems. Energy consumption minimization in computing systems has attracted a great deal of attention and has also become critical due to battery life considerations and environmental concerns. To address this problem, many task scheduling algorithms are developed using dynamic voltage and frequency scaling (DVFS). Majority of these algorithms involve two passes: schedule generation and slack reclamation. Using this approach, linear combination of frequencies has been proposed to achieve near optimal energy for systems operating with discrete and traditional voltage frequency pairs. In RAKSHA, we propose a new slack reclamation algorithm, aggressive dynamic and voltage scaling (ADVFS), using reliable and aggressive systems. ADVFS exploits the enhanced voltage frequency spectrum offered by reliable and aggressive designs for improving energy efficiency. Formal proofs are provided to show that optimal energy for reliable and aggressive designs is either achieved by using single frequency or by linear combination of frequencies. ADVFS has been evaluated using random task graphs and our results show 18% reduction in energy when compared with continuous DVFS and over more than 33% when compared with scheme using linear combination of traditional voltage frequency pairs. Recent events have indicated that attackers are banking on side-channel attacks, such as differential power analysis (DPA) and correlation power analysis (CPA), to exploit information leaks from physical devices. Random dynamic voltage frequency scaling (RDVFS) has been proposed to prevent such attacks and has very little area, power, and performance overheads. But due to the one-to-one mapping present between voltage and frequency of DVFS voltage-frequency pairs, RDVFS cannot prevent power attacks. In RAKSHA, we propose a novel countermeasure that uses reliable and aggressive designs to break this one-to-one mapping. Our experiments show that our technique significantly reduces the correlation for the actual key and also reduces the risk of power attacks by increasing the probability for incorrect keys to exhibit maximum correlation. Moreover, our scheme also enables systems to operate beyond the worst-case estimates to offer improved power and performance benefits. For the experiments conducted on AES S-box implemented using 45nm CMOS technology, our approach has increased performance by 22% over the worst-case estimates. Also, it has decreased the correlation for the correct key by an order and has increased the probability by almost 3.5X times for wrong keys when compared with the original key to exhibit maximum correlation. Overall, RAKSHA offers a new way to balance the intricate interplay between various design constraints for the systems designed using small scaled-technologies

Soft Error Mitigation Schemes for High Performance and Aggressive Designs

In this paper, we address the issue of soft errors in random logic and develop solutions that provide fault tolerance capabilities without logic duplication. First, we present a circuit level soft error mitigation technique which allows systems to operate without the performance overhead of soft error detection and correction circuitry. This is achieved by sampling data using our Soft Error Mitigation (SEM) register cell, which uses a distributed and temporal voting scheme for soft error detection and correction. Next, we present a scheme to concurrently detect and correct soft and timing errors using a Soft and Timing Error Mitigation (STEM) register cell, which offers soft error protection in aggressive designs that allow overclocking. Timing annotated gate level simulations, using 45nm libraries, of a pipelined adder-multiplier circuit and five-stage DLX processor show that both of our techniques achieve near 100% fault coverage. For DLX processor, even under severe fault injection campaigns, SEM achieves an average performance improvement of 26.58% over a temporal Triple Modular Redundancy (TMR) voter based register cell, while STEM outperforms SEM by 27.42%

Superscalar Processor Performance Enhancement through Reliable Dynamic Clock Frequency Tuning

Synchronous circuits are typically clocked considering worst case timing paths so that timing errors are avoided under all circumstances. In the case of a pipelined processor, this has special implications since the operating frequency of the entire pipeline is limited by the slowest stage. Our goal, in this paper, is to achieve higher performance in superscalar processors by dynamically varying the operating frequency during run time past worst case limits. The key objective is to see the effect of overclocking on superscalar processors for various benchmark applications, and analyze the associated overhead, in terms of extra hardware and error recovery penalty, when the clock frequency is adjusted dynamically. We tolerate timing errors occurring at speeds higher than what the circuit is designed to operate at by implementing an efficient error detection and recovery mechanism. We also study the limitations imposed by minimum path constraints on our technique. Experimental results show that an average performance gain up to 57% across all benchmark applications is achievable

Low overhead Soft Error Mitigation techniques for high-performance and aggressive systems

The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this paper, we propose two techniques, namely soft error mitigation (SEM) and soft and timing error mitigation (STEM), for protecting combinational logic blocks from soft errors. Our first technique (SEM), based on distributed and temporal voting of three registers, unloads the soft error detection overhead from the critical path of the systems. Our second technique (STEM) adds timing error detection capability to guarantee reliable execution in aggressively clocked designs that enhance system performance by operating beyond worst-case clock frequency. We also present a specialized low overhead clock generation scheme that ably supports our proposed techniques. Timing annotated gate level simulations, using 45 nm libraries, of a pipelined adder-multiplier and DLX processor show that both our techniques achieve near 100% fault coverage. For DLX processor, even under severe fault injection campaigns, SEM achieves an average performance improvement of 26.58% over a conventional triple modular redundancy voter based soft error mitigation scheme, while STEM outperforms SEM by 27.42%