Comparison of Three Stiffness Testers

Stiffness is defined and some of the factors affecting stiffness are given. Also, the underlying principles upon which most stiffness testers are based are given. Three of the commonly used stiffness instruments are used for this comparison study. They are: Gurley, Smith-Taber, and the Clark. The correlation between the instruments is determined and the stiffness range that each instrument is best suited for is noted

Transfer of training among non-traditional students in higher education: testing the theory of planned behavior

This study tested the predictive validity of Ajzen’s theory of planned behavior with a sample of 182 non-traditional students in higher education to develop our understanding of non-traditional students’ intentions to transfer trained knowledge and skills from university courses to the workplace. After completing their courses, a survey measured behavioral, normative, and control beliefs, transfer attitudes, perceived social norms, transfer self-efficacy, and transfer intentions. One year later, a follow-up survey measured transfer of training. Partial least squares-based structural equation modeling (PLS-SEM) revealed that behavioral beliefs were positively associated with transfer attitudes, normative beliefs were positively associated with social norms, and control beliefs were positively associated with self-efficacy. Transfer attitudes and transfer self-efficacy predicted transfer intentions. Social norms, however, were non-significantly associated with intentions. Transfer intentions and transfer self-efficacy predicted transfer 1 year after training. These findings are discussed in terms of their predictive validity of Ajzen’s theory and their educational implications for non-traditional students enrolled in higher education programs

A low-speed BIST framework for high-performance circuit testing

Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to their limited high frequency capabilities. In this article we outline a design-for-test methodology such that high performance devices can be tested on relatively low performance testers. In addition, a BIST framework is discussed based on this methodology. Various implementation aspects of this technique are also addresse

Quantum Property Testing

A language L has a property tester if there exists a probabilistic algorithm that given an input x only asks a small number of bits of x and distinguishes the cases as to whether x is in L and x has large Hamming distance from all y in L. We define a similar notion of quantum property testing and show that there exist languages with quantum property testers but no good classical testers. We also show there exist languages which require a large number of queries even for quantumly testing