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3 research outputs found
Single-event charge collection and upset in 65-nm and 40-nm dual- and triple-well bulk CMOS SRAMS
Author
Chatterjee Indranil
Publication venue
VANDERBILT
Publication date
Field of study
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Single-Event Upset Technology Scaling Trends of Unhardened and Hardened Flip-Flops in Bulk CMOS
Author
Gaspard Nelson Joseph III
Publication venue
VANDERBILT
Publication date
Field of study
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Impact of Designer-Controlled Parameters on Single-Event Responses for Flip-Flop Designs in Advanced Technologies
Author
Zhang Hangfang
Publication venue
VANDERBILT
Publication date
Field of study
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