Layout level design for testability strategy applied to a CMOS cell library

The layout level design for testability (LLDFT) rules used here allow to avoid some hard to detect faults or even undetectable faults on a cell library by modifying the cell layout without changing their behavior and achieving a good level of reliability. These rules avoid some open faults or reduce their appearance probability. The main purpose has been to apply that set of LLDFT rules on the cells of the library designed at the Centre Nacional de Microelectronica (CNM) in order to obtain a highly testable cell library. The authors summarize the main results (area overhead and performance degradation) of the application of the LLDFT rules on the cell

The Art of Fault Injection

Classical greek philosopher considered the foremost virtues to be temperance, justice, courage, and prudence. In this paper we relate these cardinal virtues to the correct methodological approaches that researchers should follow when setting up a fault injection experiment. With this work we try to understand where the "straightforward pathway" lies, in order to highlight those common methodological errors that deeply influence the coherency and the meaningfulness of fault injection experiments. Fault injection is like an art, where the success of the experiments depends on a very delicate balance between modeling, creativity, statistics, and patience

Product assurance technology for custom LSI/VLSI electronics

The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification

Fault-tolerant quantum computation versus Gaussian noise

We study the robustness of a fault-tolerant quantum computer subject to Gaussian non-Markovian quantum noise, and we show that scalable quantum computation is possible if the noise power spectrum satisfies an appropriate "threshold condition." Our condition is less sensitive to very-high-frequency noise than previously derived threshold conditions for non-Markovian noise.Comment: 30 pages, 6 figure

Model-based dependability analysis : state-of-the-art, challenges and future outlook

Abstract: Over the past two decades, the study of model-based dependability analysis has gathered significant research interest. Different approaches have been developed to automate and address various limitations of classical dependability techniques to contend with the increasing complexity and challenges of modern safety-critical system. Two leading paradigms have emerged, one which constructs predictive system failure models from component failure models compositionally using the topology of the system. The other utilizes design models - typically state automata - to explore system behaviour through fault injection. This paper reviews a number of prominent techniques under these two paradigms, and provides an insight into their working mechanism, applicability, strengths and challenges, as well as recent developments within these fields. We also discuss the emerging trends on integrated approaches and advanced analysis capabilities. Lastly, we outline the future outlook for model-based dependability analysis

A fault injection experiment using the AIRLAB Diagnostic Emulation Facility

The preparation for, conduct of, and results of a simulation based fault injection experiment conducted using the AIRLAB Diagnostic Emulation facilities is described. An objective of this experiment was to determine the effectiveness of the diagnostic self-test sequences used to uncover latent faults in a logic network providing the key fault tolerance features for a flight control computer. Another objective was to develop methods, tools, and techniques for conducting the experiment. More than 1600 faults were injected into a logic gate level model of the Data Communicator/Interstage (C/I). For each fault injected, diagnostic self-test sequences consisting of over 300 test vectors were supplied to the C/I model as inputs. For each test vector within a test sequence, the outputs from the C/I model were compared to the outputs of a fault free C/I. If the outputs differed, the fault was considered detectable for the given test vector. These results were then analyzed to determine the effectiveness of some test sequences. The results established coverage of selt-test diagnostics, identified areas in the C/I logic where the tests did not locate faults, and suggest fault latency reduction opportunities

The Role of Correlated Noise in Quantum Computing

This paper aims to give an overview of the current state of fault-tolerant quantum computing, by surveying a number of results in the field. We show that thresholds can be obtained for a simple noise model as first proved in [AB97, Kit97, KLZ98], by presenting a proof for statistically independent noise, following the presentation of Aliferis, Gottesman and Preskill [AGP06]. We also present a result by Terhal and Burkard [TB05] and later improved upon by Aliferis, Gottesman and Preskill [AGP06] that shows a threshold can still be obtained for local non-Markovian noise, where we allow the noise to be weakly correlated in space and time. We then turn to negative results, presenting work by Ben-Aroya and Ta-Shma [BT11] who showed conditional errors cannot be perfectly corrected. We end our survey by briefly mentioning some more speculative objections, as put forth by Kalai [Kal08, Kal09, Kal11]

Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault-Injection

International audienceLaser fault injections induce transient faults into ICs by locally generating transient currents that temporarily flip the outputs of the illuminated gates. Laser fault injection can be anticipated or studied by using simulation tools at different abstraction levels: physical, electrical or logical. At the electrical level, the classical laser-fault injection model is based on the addition of current sources to the various sensitive nodes of CMOS transistors. However, this model does not take into account the large transient current components also induced between the VDD and GND of ICs designed with advanced CMOS technologies. These short-circuit currents provoke a significant IR-drop that contribute to the fault injection process. This paper describes our research on the assessment of this contribution. It shows through simulation and experiments that during laser fault injection campaigns, laser-induced IR-drop is always present when considering circuits designed with deep submicron technologies. It introduces an enhanced electrical fault model taking the laser-induced IR-drop into account. It also proposes a methodology that allows the use of the model to simulate laser-induced faults at the electrical level in large-scale circuits. On the basis of further simulations and experimental results, we found that, depending on the laser pulse characteristics, the number of injected faults may be underestimated by a factor of up to 2.4 if the laser-induced IR-drop is ignored. This could lead to incorrect estimations of the fault injection threshold, which is especially relevant to the design of countermeasure techniques for secure integrated systems