Constraint-driven RF test stimulus generation and built-in test

With the explosive growth in wireless applications, the last decade witnessed an ever-increasing test challenge for radio frequency (RF) circuits. While the design community has pushed the envelope far into the future, by expanding CMOS process to be used with high-frequency wireless devices, test methodology has not advanced at the same pace. Consequently, testing such devices has become a major bottleneck in high-volume production, further driven by the growing need for tighter quality control. RF devices undergo testing during the prototype phase and during high-volume manufacturing (HVM). The benchtop test equipment used throughout prototyping is very precise yet specialized for a subset of functionalities. HVM calls for a different kind of test paradigm that emphasizes throughput and sufficiency, during which the projected performance parameters are measured one by one for each device by automated test equipment (ATE) and compared against defined limits called specifications. The set of tests required for each product differs greatly in terms of the equipment required and the time taken to test individual devices. Together with signal integrity, precision, and repeatability concerns, the initial cost of RF ATE is prohibitively high. As more functionality and protocols are integrated into a single RF device, the required number of specifications to be tested also increases, adding to the overall cost of testing, both in terms of the initial and recurring operating costs. In addition to the cost problem, RF testing proposes another challenge when these components are integrated into package-level system solutions. In systems-on-packages (SOP), the test problems resulting from signal integrity, input/output bandwidth (IO), and limited controllability and observability have initiated a paradigm shift in high-speed analog testing, favoring alternative approaches such as built-in tests (BIT) where the test functionality is brought into the package. This scheme can make use of a low-cost external tester connected through a low-bandwidth link in order to perform demanding response evaluations, as well as make use of the analog-to-digital converters and the digital signal processors available in the package to facilitate testing. Although research on analog built-in test has demonstrated hardware solutions for single specifications, the paradigm shift calls for a rather general approach in which a single methodology can be applied across different devices, and multiple specifications can be verified through a single test hardware unit, minimizing the area overhead. Specification-based alternate test methodology provides a suitable and flexible platform for handling the challenges addressed above. In this thesis, a framework that integrates ATE and system constraints into test stimulus generation and test response extraction is presented for the efficient production testing of high-performance RF devices using specification-based alternate tests. The main components of the presented framework are as follows: Constraint-driven RF alternate test stimulus generation: An automated test stimulus generation algorithm for RF devices that are evaluated by a specification-based alternate test solution is developed. The high-level models of the test signal path define constraints in the search space of the optimized test stimulus. These models are generated in enough detail such that they inherently define limitations of the low-cost ATE and the I/O restrictions of the device under test (DUT), yet they are simple enough that the non-linear optimization problem can be solved empirically in a reasonable amount of time. Feature extractors for BIT: A methodology for the built-in testing of RF devices integrated into SOPs is developed using additional hardware components. These hardware components correlate the high-bandwidth test response to low bandwidth signatures while extracting the test-critical features of the DUT. Supervised learning is used to map these extracted features, which otherwise are too complicated to decipher by plain mathematical analysis, into the specifications under test. Defect-based alternate testing of RF circuits: A methodology for the efficient testing of RF devices with low-cost defect-based alternate tests is developed. The signature of the DUT is probabilistically compared with a class of defect-free device signatures to explore possible corners under acceptable levels of process parameter variations. Such a defect filter applies discrimination rules generated by a supervised classifier and eliminates the need for a library of possible catastrophic defects.Ph.D.Committee Chair: Chatterjee, Abhijit; Committee Member: Durgin, Greg; Committee Member: Keezer, David; Committee Member: Milor, Linda; Committee Member: Sitaraman, Sures

Space shuttle avionics system

The Space Shuttle avionics system, which was conceived in the early 1970's and became operational in the 1980's represents a significant advancement of avionics system technology in the areas of systems and redundacy management, digital data base technology, flight software, flight control integration, digital fly-by-wire technology, crew display interface, and operational concepts. The origins and the evolution of the system are traced; the requirements, the constraints, and other factors which led to the final configuration are outlined; and the functional operation of the system is described. An overall system block diagram is included

Mariner IV Mission to Mars. Part I

This technical report is a series of individual papers documenting the Mariner-Mars project from its beginning in 1962 following the successful Mariner-Venus mission. Part I is pre-encounter data. It includes papers on the design, development, and testing of Mariner IV, as well as papers detailing methods of maintaining communication with and obtaining data from the spacecraft during flight, and expected results during encounter with Mars. Part 11, post-encounter data, to be published later, will consist of documentation of the events taking place during Mariner IV's encounter with Mars and thereafter. The Mariner-Mars mission, the culmination of an era of spacecraft development, has contributed much new technology to be used in future projects

Testing of Analog and RF Circuits using Embedded Sensors

Testing of on - chip RF and microwave circuits has always been a challenge to the test engineers. Since the emergence of System - on - a - Chip (SoC), characterization and test de vel op ment is time - consuming, they contribute to a significant part of the manufacturing cost. Moreover, test development of RF and microwave circuits requires years of experience and expertise. In this paper, we propose to use built - in - test in the form of specific sensors. Instead of testing the devices specifically for certain performance metrics, the output values of the sensors, which are usually DC or a very low frequency signal, can b e used to get a quick and accurate estimate of the behavior of the devic e under test (DUT). For a relatively low - yielding process, which is usually the case for RF and microwave circuits, significant number of faulty devices can be identified without even performing the standard manufacturing test on the devices. Moreover, the se sensors can also be used for on - line test. In this paper, we also propose an algorithm to optimally place the sensors at the output of a system - under - test and use the sensor output to get an estimate of the specifications of the system - under - test. Using this method, specifications can be estimated within an accuracy of ± 3% of its actual value

High-speed civil transport flight- and propulsion-control technological issues

Technology advances required in the flight and propulsion control system disciplines to develop a high speed civil transport (HSCT) are identified. The mission and requirements of the transport and major flight and propulsion control technology issues are discussed. Each issue is ranked and, for each issue, a plan for technology readiness is given. Certain features are unique and dominate control system design. These features include the high temperature environment, large flexible aircraft, control-configured empennage, minimizing control margins, and high availability and excellent maintainability. The failure to resolve most high-priority issues can prevent the transport from achieving its goals. The flow-time for hardware may require stimulus, since market forces may be insufficient to ensure timely production. Flight and propulsion control technology will contribute to takeoff gross weight reduction. Similar technology advances are necessary also to ensure flight safety for the transport. The certification basis of the HSCT must be negotiated between airplane manufacturers and government regulators. Efficient, quality design of the transport will require an integrated set of design tools that support the entire engineering design team

The International Linear Collider

In this article, we describe the key features of the recently completed technical design for the International Linear Collider (ILC), a 200-500 GeV linear electron-positron collider (expandable to 1 TeV) that is based on 1.3 GHz superconducting radio-frequency (SCRF) technology. The machine parameters and detector characteristics have been chosen to complement the Large Hadron Collider physics, including the discovery of the Higgs boson, and to further exploit this new particle physics energy frontier with a precision instrument. The linear collider design is the result of nearly twenty years of R&D, resulting in a mature conceptual design for the ILC project that reflects an international consensus. We summarize the physics goals and capability of the ILC, the enabling R&D and resulting accelerator design, as well as the concepts for two complementary detectors. The ILC is technically ready to be proposed and built as a next generation lepton collider, perhaps to be built in stages beginning as a Higgs factory.Comment: 41 page

Viking '75 spacecraft design and test summary. Volume 3: Engineering test summary

The engineering test program for the lander and the orbiter are presented. The engineering program was developed to achieve confidence that the design was adequate to survive the expected mission environments and to accomplish the mission objective

Advanced space system concepts and their orbital support needs (1980 - 2000). Volume 2: Final report

The results are presented of a study which identifies over 100 new and highly capable space systems for the 1980-2000 time period: civilian systems which could bring benefits to large numbers of average citizens in everyday life, much enhance the kinds and levels of public services, increase the economic motivation for industrial investment in space, expand scientific horizons; and, in the military area, systems which could materially alter current concepts of tactical and strategic engagements. The requirements for space transportation, orbital support, and technology for these systems are derived, and those requirements likely to be shared between NASA and the DoD in the time period identified. The high leverage technologies for the time period are identified as very large microwave antennas and optics, high energy power subsystems, high precision and high power lasers, microelectronic circuit complexes and data processors, mosaic solid state sensing devices, and long-life cryogenic refrigerators