Tracing Fault Effects in FPGA Systems

The paper presents the extent of fault effects in FPGA based systems and concentrates on transient faults (induced by single event upsets – SEUs) within the configuration memory of FPGA. An original method of detailed analysis of fault effect propagation is presented. It is targeted at microprocessor based FPGA systems using the developed fault injection technique. The fault injection is performed at HDL description level of the microprocessor using special simulators and developed supplementary programs. The proposed methodology is illustrated for soft PicoBlaze microprocessor running 3 programs. The presented results reveal some problems with fault handling at the software level.

Parity Codes Used for On-Line Testing in FPGA

This paper deals with on-line error detection in digital circuits implemented in FPGAs. Error detection codes have been used to ensure the self-checking property. The adopted fault model is discussed. A fault in a given combinational circuit must be detected and signalized at the time of its appearance and before further distribution of errors. Hence safe operation of the designed system is guaranteed. The check bits generator and the checker were added to the original combinational circuit to detect an error during normal circuit operation. This concurrent error detection ensures the Totally Self-Checking property. Combinational circuit benchmarks have been used in this work in order to compute the quality of the proposed codes. The description of the benchmarks is based on equations and tables. All of our experimental results are obtained by XILINX FPGA implementation EDA tools. A possible TSC structure consisting of several TSC blocks is presented.

Optimizing Scrubbing by Netlist Analysis for FPGA Configuration Bit Classification and Floorplanning

Existing scrubbing techniques for SEU mitigation on FPGAs do not guarantee an error-free operation after SEU recovering if the affected configuration bits do belong to feedback loops of the implemented circuits. In this paper, we a) provide a netlist-based circuit analysis technique to distinguish so-called critical configuration bits from essential bits in order to identify configuration bits which will need also state-restoring actions after a recovered SEU and which not. Furthermore, b) an alternative classification approach using fault injection is developed in order to compare both classification techniques. Moreover, c) we will propose a floorplanning approach for reducing the effective number of scrubbed frames and d), experimental results will give evidence that our optimization methodology not only allows to detect errors earlier but also to minimize the Mean-Time-To-Repair (MTTR) of a circuit considerably. In particular, we show that by using our approach, the MTTR for datapath-intensive circuits can be reduced by up to 48.5% in comparison to standard approaches

UA2TPG: An untestability analyzer and test pattern generator for SEUs in the configuration memory of SRAM-based FPGAs

This paper presents UA2TPG, a static analysis tool for the untestability proof and automatic test pattern generation for SEUs in the configuration memory of SRAM-based FPGA systems. The tool is based on the model-checking verification technique. An accurate fault model for both logic components and routing structures is adopted. Experimental results show that many circuits have a significant number of untestable faults, and their detection enables more efficient test pattern generation and on-line testing. The tool is mainly intended to support on-line testing of critical components in FPGA fault-tolerant systems

Fault-Tolerant FPGA-Based Systems

This paper presents a new approach to on-line fault tolerance via reconfiguration for the systems mapped onto field programmable gate arrays (FPGAs). The fault detection, based on self-checking technique, is introduced at application level; therefore our approach can detect the faults of configurable logic blocks (CLBs) and routing interconnections in the FPGAs concurrently with the normal system work. A grid of tiles is projected on the FPGA structure and a certain number of spare CLBs is reserved inside every tile. The number of spare CLBs per tile, which will be used as a backup upon detecting any faulty CLB, is estimated in accordance with the probability of failure. After locating the faulty CLBs, the faulty tile will be reconfigured with avoiding the faulty CLBs. Our proposed approach uses a combination of hardware and software redundancy. We assume that a module external to the FPGA controls automatically the reconfiguration process in addition to the diagnosis process (DIRC); typically this is an embedded microprocessor having some storage for the various tile configurations. We have implemented our approach using Xilinx Virtex FPGA. The DIRC code is written in JBits software tools. In response to a component failure this approach capitalizes on the unique reconfiguration capabilities of FPGAs and replaces the affected tile with a functionally equivalent one that does not rely on the faulty component. Unlike fixed structure fault-tolerance techniques for ASICs and microprocessors, this approach allows a single physical component to provide redundant backup for several types of components

Fault-tolerant fpga for mission-critical applications.

One of the devices that play a great role in electronic circuits design, specifically safety-critical design applications, is Field programmable Gate Arrays (FPGAs). This is because of its high performance, re-configurability and low development cost. FPGAs are used in many applications such as data processing, networks, automotive, space and industrial applications. Negative impacts on the reliability of such applications result from moving to smaller feature sizes in the latest FPGA architectures. This increases the need for fault-tolerant techniques to improve reliability and extend system lifetime of FPGA-based applications. In this thesis, two fault-tolerant techniques for FPGA-based applications are proposed with a built-in fault detection region. A low cost fault detection scheme is proposed for detecting faults using the fault detection region used in both schemes. The fault detection scheme primarily detects open faults in the programmable interconnect resources in the FPGAs. In addition, Stuck-At faults and Single Event Upsets (SEUs) fault can be detected. For fault recovery, each scheme has its own fault recovery approach. The first approach uses a spare module and a 2-to-1 multiplexer to recover from any fault detected. On the other hand, the second approach recovers from any fault detected using the property of Partial Reconfiguration (PR) in the FPGAs. It relies on identifying a Partially Reconfigurable block (P_b) in the FPGA that is used in the recovery process after the first faulty module is identified in the system. This technique uses only one location to recover from faults in any of the FPGA’s modules and the FPGA interconnects. Simulation results show that both techniques can detect and recover from open faults. In addition, Stuck-At faults and Single Event Upsets (SEUs) fault can also be detected. Finally, both techniques require low area overhead