Soft-error resilient on-chip memory structures

Soft errors induced by energetic particle strikes in on-chip memory structures, such as L1 data/instruction caches and register files, have become an increasing challenge in designing new generation reliable microprocessors. Due to their transient/random nature, soft errors cannot be captured by traditional verification and testing process due to the irrelevancy to the correctness of the logic. This dissertation is thus focusing on the reliability characterization and cost-effective reliable design of on-chip memories against soft errors. Due to various performance, area/size, and energy constraints in various target systems, many existing unoptimized protection schemes on cache memories may eventually prove significantly inadequate and ineffective. This work develops new lifetime models for data and tag arrays residing in both the data and instruction caches. These models facilitate the characterization of cache vulnerability of the stored items at various lifetime phases. The design methodology is further exemplified by the proposed reliability schemes targeting at specific vulnerable phases. Benchmarking is carried out to showcase the effectiveness of these approaches. The tag array demands high reliability against soft errors while the data array is fully protected in on-chip caches, because of its crucial importance to the correctness of cache accesses. Exploiting the address locality of memory accesses, this work proposes a Tag Replication Buffer (TRB) to protect information integrity of the tag array in the data cache with low performance, energy and area overheads. To provide a comprehensive evaluation of the tag array reliability, this work also proposes a refined evaluation metric, detected-without-replica-TVF (DOR-TVF), which combines the TVF and access-with-replica (AWR) analysis. Based on the DOR-TVF analysis, a TRB scheme with early write-back (TRB-EWB) is proposed, which achieves a zero DOR-TVF at a negligible performance overhead. Recent research, as well as the proposed optimization schemes in this cache vulnerability study, have focused on the design of cost-effective reliable data caches in terms of performance, energy, and area overheads based on the assumption of fixed error rates. However, for systems in operating environments that vary with time or location, those schemes will be either insufficient or over-designed for the changing error rates. This work explores the design of a self-adaptive reliable data cache that dynamically adapts its employed reliability schemes to the changing operating environments in order to maintain a target reliability. The experimental evaluation shows that the self-adaptive data cache achieves similar reliability to a cache protected by the most reliable scheme, while simultaneously minimizing the performance and power overheads. Besides the data/instruction caches, protecting the register file and its data buses is crucial to reliable computing in high-performance microprocessors. Since the register file is in the critical path of the processor pipeline, any reliable design that increases either the pressure on the register file or the register file access latency is not desirable. This work proposes to exploit narrow-width register values, which represent the majority of generated values, for making the duplicates within the same register data item. A detailed architectural vulnerability factor (AVF) analysis shows that this in-register duplication (IRD) scheme significantly reduces the AVF in the register file compared to the conventional design. The experimental evaluation also shows that IRD provides superior read-with-duplicate (RWD) and error detection/recovery rates under heavy error injection as compared to previous reliability schemes, while only incurring a small power overhead. By integrating the proposed reliable designs in data/instruction caches and register files, the vulnerability of the entire microprocessor is dramatically reduced. The new lifetime model, the self-adaptive design and the narrow-width value duplication scheme proposed in this work can also provide guidance to architects toward highly efficient reliable system design

ReDO: Cross-Layer Multi-Objective Design-Exploration Framework for Efficient Soft Error Resilient Systems

Designing soft errors resilient systems is a complex engineering task, which nowadays follows a cross-layer approach. It requires a careful planning for different fault-tolerance mechanisms at different system's layers: starting from the technology up to the software domain. While these design decisions have a positive effect on the reliability of the system, they usually have a detrimental effect on its size, power consumption, performance and cost. Design space exploration for cross-layer reliability is therefore a multi-objective search problem in which reliability must be traded-off with other design dimensions. This paper proposes a cross-layer multi-objective design space exploration algorithm developed to help designers when building soft error resilient electronic systems. The algorithm exploits a system-level Bayesian reliability estimation model to analyze the effect of different cross-layer combinations of protection mechanisms on the reliability of the full system. A new heuristic based on the extremal optimization theory is used to efficiently explore the design space. An extended set of simulations shows the capability of this framework when applied both to benchmark applications and realistic systems, providing optimized systems that outperform those obtained by applying state-of-the-art cross-layer reliability techniques

Adaptive-hybrid Redundancy with Error Injection

Adaptive-Hybrid Redundancy (AHR) shows promise as a method to allow flexibility when selecting between processing speed and energy efficiency while maintaining a level of error mitigation in space radiation environments. Whereas previous work demonstrated AHR’s feasibility in an error free environment, this work analyzes AHR performance in the presence of errors. Errors are deliberately injected into AHR at specific times in the processing chain to demonstrate best and worst case performance impacts. This analysis demonstrates that AHR provides flexibility in processing speed and energy efficiency in the presence of error

Cross layer reliability estimation for digital systems

Forthcoming manufacturing technologies hold the promise to increase multifuctional computing systems performance and functionality thanks to a remarkable growth of the device integration density. Despite the benefits introduced by this technology improvements, reliability is becoming a key challenge for the semiconductor industry. With transistor size reaching the atomic dimensions, vulnerability to unavoidable fluctuations in the manufacturing process and environmental stress rise dramatically. Failing to meet a reliability requirement may add excessive re-design cost to recover and may have severe consequences on the success of a product. %Worst-case design with large margins to guarantee reliable operation has been employed for long time. However, it is reaching a limit that makes it economically unsustainable due to its performance, area, and power cost. One of the open challenges for future technologies is building ``dependable'' systems on top of unreliable components, which will degrade and even fail during normal lifetime of the chip. Conventional design techniques are highly inefficient. They expend significant amount of energy to tolerate the device unpredictability by adding safety margins to a circuit's operating voltage, clock frequency or charge stored per bit. Unfortunately, the additional cost introduced to compensate unreliability are rapidly becoming unacceptable in today's environment where power consumption is often the limiting factor for integrated circuit performance, and energy efficiency is a top concern. Attention should be payed to tailor techniques to improve the reliability of a system on the basis of its requirements, ending up with cost-effective solutions favoring the success of the product on the market. Cross-layer reliability is one of the most promising approaches to achieve this goal. Cross-layer reliability techniques take into account the interactions between the layers composing a complex system (i.e., technology, hardware and software layers) to implement efficient cross-layer fault mitigation mechanisms. Fault tolerance mechanism are carefully implemented at different layers starting from the technology up to the software layer to carefully optimize the system by exploiting the inner capability of each layer to mask lower level faults. For this purpose, cross-layer reliability design techniques need to be complemented with cross-layer reliability evaluation tools, able to precisely assess the reliability level of a selected design early in the design cycle. Accurate and early reliability estimates would enable the exploration of the system design space and the optimization of multiple constraints such as performance, power consumption, cost and reliability. This Ph.D. thesis is devoted to the development of new methodologies and tools to evaluate and optimize the reliability of complex digital systems during the early design stages. More specifically, techniques addressing hardware accelerators (i.e., FPGAs and GPUs), microprocessors and full systems are discussed. All developed methodologies are presented in conjunction with their application to real-world use cases belonging to different computational domains

Adaptive-Hybrid Redundancy for Radiation Hardening

An Adaptive-Hybrid Redundancy (AHR) mitigation strategy is proposed to mitigate the effects of Single Event Upset (SEU) and Single Event Transient (SET) radiation effects. AHR is adaptive because it switches between Triple Modular Redundancy (TMR) and Temporal Software Redundancy (TSR). AHR is hybrid because it uses hardware and software redundancy. AHR is demonstrated to run faster than TSR and use less energy than TMR. Furthermore, AHR allows space vehicle designers, mission planners, and operators the flexibility to determine how much time is spent in TMR and TSR. TMR mode provides faster processing at the expense of greater energy usage. TSR mode uses less energy at the expense of processing speed. AHR allows the user to determine the optimal balance between these modes based on their mission needs and changes can be made even after the space vehicle is operational. Radiation testing was performed to determine the SEU injection rate for simulations and analyses. A Field Programmable Gate Array (FPGA) was used to expedite testing in hardware