247,742 research outputs found

    Power-aware system-on-chip test scheduling using enhanced rectangle packing algorithm

    Get PDF
    The current semiconductor technology allows integration of all components onto a single chip called system-on-chip (SoC), which scales down the size of product and improves the performance. When a system becomes more complicated, testing process, such as test scheduling, becomes more challenging. Recently, peak power has also been considered as constraints in the test scheduling problem. Besides these constraints, some add-on techniques including pre-emption and non-consecutive test bus assignment have been introduced. The main contribution of each technique is the reduction of idling time in the test scheduling and thus reducing the total test time. This paper proposes a power-aware test scheduling called enhanced rectangle packing (ERP). In this technique, we formulate the test scheduling problem as the rectangle packing with horizontally and vertically split-able items (rectangles) which are smaller to fill up more compactly the test scheduling floor plan. Experimental results conducted on ITC'02 SoC benchmark circuits revealed positive improvement of the power-aware ERP algorithm in reducing total SoC test time

    Thermal-Safe Test Scheduling for Core-Based System-on-a-Chip Integrated Circuits

    No full text
    Overheating has been acknowledged as a major problem during the testing of complex system-on-chip (SOC) integrated circuits. Several power-constrained test scheduling solutions have been recently proposed to tackle this problem during system integration. However, we show that these approaches cannot guarantee hot-spot-free test schedules because they do not take into account the non-uniform distribution of heat dissipation across the die and the physical adjacency of simultaneously active cores. This paper proposes a new test scheduling approach that is able to produce short test schedules and guarantee thermal-safety at the same time. Two thermal-safe test scheduling algorithms are proposed. The first algorithm computes an exact (shortest) test schedule that is guaranteed to satisfy a given maximum temperature constraint. The second algorithm is a heuristic intended for complex systems with a large number of embedded cores, for which the exact thermal-safe test scheduling algorithm may not be feasible. Based on a low-complexity test session thermal cost model, this algorithm produces near-optimal length test schedules with significantly less computational effort compared to the optimal algorithm

    A linear programming-based method for job shop scheduling

    Get PDF
    We present a decomposition heuristic for a large class of job shop scheduling problems. This heuristic utilizes information from the linear programming formulation of the associated optimal timing problem to solve subproblems, can be used for any objective function whose associated optimal timing problem can be expressed as a linear program (LP), and is particularly effective for objectives that include a component that is a function of individual operation completion times. Using the proposed heuristic framework, we address job shop scheduling problems with a variety of objectives where intermediate holding costs need to be explicitly considered. In computational testing, we demonstrate the performance of our proposed solution approach

    Scheduling with a Limited Testing Budget

    Full text link
    Scheduling with testing falls under the umbrella of the research on optimization with explorable uncertainty. In this model, each job has an upper limit on its processing time that can be decreased to a lower limit (possibly unknown) by some preliminary action (testing). Recently, D{\"{u}}rr et al. \cite{DBLP:journals/algorithmica/DurrEMM20} has studied a setting where testing a job takes a unit time, and the goal is to minimize total completion time or makespan on a single machine. In this paper, we extend their problem to the budget setting in which each test consumes a job-specific cost, and we require that the total testing cost cannot exceed a given budget. We consider the offline variant (the lower processing time is known) and the oblivious variant (the lower processing time is unknown) and aim to minimize the total completion time or makespan on a single machine. For the total completion time objective, we show NP-hardness and derive a PTAS for the offline variant based on a novel LP rounding scheme. We give a (4+ϵ)(4+\epsilon)-competitive algorithm for the oblivious variant based on a framework inspired by the worst-case lower-bound instance. For the makespan objective, we give an FPTAS for the offline variant and a (2+ϵ)(2+\epsilon)-competitive algorithm for the oblivious variant. Our algorithms for the oblivious variants under both objectives run in time O(poly(n/ϵ))O(poly(n/\epsilon)). Lastly, we show that our results are essentially optimal by providing matching lower bounds.Comment: To appear in ESA 202
    corecore