Ranking News-Quality Multimedia

News editors need to find the photos that best illustrate a news piece and fulfill news-media quality standards, while being pressed to also find the most recent photos of live events. Recently, it became common to use social-media content in the context of news media for its unique value in terms of immediacy and quality. Consequently, the amount of images to be considered and filtered through is now too much to be handled by a person. To aid the news editor in this process, we propose a framework designed to deliver high-quality, news-press type photos to the user. The framework, composed of two parts, is based on a ranking algorithm tuned to rank professional media highly and a visual SPAM detection module designed to filter-out low-quality media. The core ranking algorithm is leveraged by aesthetic, social and deep-learning semantic features. Evaluation showed that the proposed framework is effective at finding high-quality photos (true-positive rate) achieving a retrieval MAP of 64.5% and a classification precision of 70%.Comment: To appear in ICMR'1

Machine Learning for Microcontroller-Class Hardware -- A Review

The advancements in machine learning opened a new opportunity to bring intelligence to the low-end Internet-of-Things nodes such as microcontrollers. Conventional machine learning deployment has high memory and compute footprint hindering their direct deployment on ultra resource-constrained microcontrollers. This paper highlights the unique requirements of enabling onboard machine learning for microcontroller class devices. Researchers use a specialized model development workflow for resource-limited applications to ensure the compute and latency budget is within the device limits while still maintaining the desired performance. We characterize a closed-loop widely applicable workflow of machine learning model development for microcontroller class devices and show that several classes of applications adopt a specific instance of it. We present both qualitative and numerical insights into different stages of model development by showcasing several use cases. Finally, we identify the open research challenges and unsolved questions demanding careful considerations moving forward.Comment: Accepted for publication at IEEE Sensors Journa