New Data Structures and Algorithms for Logic Synthesis and Verification

The strong interaction between Electronic Design Automation (EDA) tools and Complementary Metal-Oxide Semiconductor (CMOS) technology contributed substantially to the advancement of modern digital electronics. The continuous downscaling of CMOS Field Effect Transistor (FET) dimensions enabled the semiconductor industry to fabricate digital systems with higher circuit density at reduced costs. To keep pace with technology, EDA tools are challenged to handle both digital designs with growing functionality and device models of increasing complexity. Nevertheless, whereas the downscaling of CMOS technology is requiring more complex physical design models, the logic abstraction of a transistor as a switch has not changed even with the introduction of 3D FinFET technology. As a consequence, modern EDA tools are fine tuned for CMOS technology and the underlying design methodologies are based on CMOS logic primitives, i.e., negative unate logic functions. While it is clear that CMOS logic primitives will be the ultimate building blocks for digital systems in the next ten years, no evidence is provided that CMOS logic primitives are also the optimal basis for EDA software. In EDA, the efficiency of methods and tools is measured by different metrics such as (i) the result quality, for example the performance of a digital circuit, (ii) the runtime and (iii) the memory footprint on the host computer. With the aim to optimize these metrics, the accordance to a specific logic model is no longer important. Indeed, the key to the success of an EDA technique is the expressive power of the logic primitives handling and solving the problem, which determines the capability to reach better metrics. In this thesis, we investigate new logic primitives for electronic design automation tools. We improve the efficiency of logic representation, manipulation and optimization tasks by taking advantage of majority and biconditional logic primitives. We develop synthesis tools exploiting the majority and biconditional expressiveness. Our tools show strong results as compared to state-of-the-art academic and commercial synthesis tools. Indeed, we produce the best results for several public benchmarks. On top of the enhanced synthesis power, our methods are the natural and native logic abstraction for circuit design in emerging nanotechnologies, where majority and biconditional logic are the primitive gates for physical implementation. We accelerate formal methods by (i) studying properties of logic circuits and (ii) developing new frameworks for logic reasoning engines. We prove non-trivial dualities for the property checking problem in logic circuits. Our findings enable sensible speed-ups in solving circuit satisfiability. We develop an alternative Boolean satisfiability framework based on majority functions. We prove that the general problem is still intractable but we show practical restrictions that can be solved efficiently. Finally, we focus on reversible logic where we propose a new equivalence checking approach. We exploit the invertibility of computation and the functionality of reversible gates in the formulation of the problem. This enables one order of magnitude speed up, as compared to the state-of-the-art solution. We argue that new approaches to solve EDA problems are necessary, as we have reached a point of technology where keeping pace with design goals is tougher than ever

An ultra-low voltage FFT processor using energy-aware techniques

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, February 2004.Page 170 blank.Includes bibliographical references (p. 165-169).In a number of emerging applications such as wireless sensor networks, system lifetime depends on the energy efficiency of computation and communication. The key metric in such applications is the energy dissipated per function rather than traditional ones such as clock speed or silicon area. Hardware designs are shifting focus toward enabling energy-awareness, allowing the processor to be energy-efficient for a variety of operating scenarios. This is in contrast to conventional low-power design, which optimizes for the worst-case scenario. Here, three energy-quality scalable hooks are designed into a real-valued FFT processor: variable FFT length (N=128 to 1024 points), variable bit precision (8,16 bit), and variable voltage supply with variable clock frequency (VDD=1 80mV to 0.9V, and f=164Hz to 6MHz). A variable-bit-precision and variable-FFT-length scalable FFT ASIC using an off-the-shelf standard-cell logic library and memory only scales down to 1V operation. Further energy savings is achieved through ultra-low voltage-supply operation. As performance requirements are relaxed, the operating voltage supply is scaled down, possibly even below the threshold voltage into the subthreshold region. When lower frequencies cause leakage energy dissipation to exceed the active energy dissipation, there is an optimal operating point for minimizing energy consumption.(cont.) Logic and memory design techniques allowing ultra-low voltage operation are employed to study the optimal frequency/voltage operating point for the FFT. A full-custom implementation with circuit techniques optimized for deep voltage scaling into the subthreshold regime, is fabricated using a standard CMOS 0.18[mu]m logic process and functions down to 180mV. At the optimal operating point where the voltage supply is 350mV, the FFT processor dissipates 155nJ/FFT. The custom FFT is 8x more energy-efficient than the ASIC implementation and 350x more energy-efficient than a low-power microprocessor implementation.by Alice Wang.Ph.D

Combining SOA and BPM Technologies for Cross-System Process Automation

This paper summarizes the results of an industry case study that introduced a cross-system business process automation solution based on a combination of SOA and BPM standard technologies (i.e., BPMN, BPEL, WSDL). Besides discussing major weaknesses of the existing, custom-built, solution and comparing them against experiences with the developed prototype, the paper presents a course of action for transforming the current solution into the proposed solution. This includes a general approach, consisting of four distinct steps, as well as specific action items that are to be performed for every step. The discussion also covers language and tool support and challenges arising from the transformation

Innovative Techniques for Testing and Diagnosing SoCs

We rely upon the continued functioning of many electronic devices for our everyday welfare, usually embedding integrated circuits that are becoming even cheaper and smaller with improved features. Nowadays, microelectronics can integrate a working computer with CPU, memories, and even GPUs on a single die, namely System-On-Chip (SoC). SoCs are also employed on automotive safety-critical applications, but need to be tested thoroughly to comply with reliability standards, in particular the ISO26262 functional safety for road vehicles. The goal of this PhD. thesis is to improve SoC reliability by proposing innovative techniques for testing and diagnosing its internal modules: CPUs, memories, peripherals, and GPUs. The proposed approaches in the sequence appearing in this thesis are described as follows: 1. Embedded Memory Diagnosis: Memories are dense and complex circuits which are susceptible to design and manufacturing errors. Hence, it is important to understand the fault occurrence in the memory array. In practice, the logical and physical array representation differs due to an optimized design which adds enhancements to the device, namely scrambling. This part proposes an accurate memory diagnosis by showing the efforts of a software tool able to analyze test results, unscramble the memory array, map failing syndromes to cell locations, elaborate cumulative analysis, and elaborate a final fault model hypothesis. Several SRAM memory failing syndromes were analyzed as case studies gathered on an industrial automotive 32-bit SoC developed by STMicroelectronics. The tool displayed defects virtually, and results were confirmed by real photos taken from a microscope. 2. Functional Test Pattern Generation: The key for a successful test is the pattern applied to the device. They can be structural or functional; the former usually benefits from embedded test modules targeting manufacturing errors and is only effective before shipping the component to the client. The latter, on the other hand, can be applied during mission minimally impacting on performance but is penalized due to high generation time. However, functional test patterns may benefit for having different goals in functional mission mode. Part III of this PhD thesis proposes three different functional test pattern generation methods for CPU cores embedded in SoCs, targeting different test purposes, described as follows: a. Functional Stress Patterns: Are suitable for optimizing functional stress during I Operational-life Tests and Burn-in Screening for an optimal device reliability characterization b. Functional Power Hungry Patterns: Are suitable for determining functional peak power for strictly limiting the power of structural patterns during manufacturing tests, thus reducing premature device over-kill while delivering high test coverage c. Software-Based Self-Test Patterns: Combines the potentiality of structural patterns with functional ones, allowing its execution periodically during mission. In addition, an external hardware communicating with a devised SBST was proposed. It helps increasing in 3% the fault coverage by testing critical Hardly Functionally Testable Faults not covered by conventional SBST patterns. An automatic functional test pattern generation exploiting an evolutionary algorithm maximizing metrics related to stress, power, and fault coverage was employed in the above-mentioned approaches to quickly generate the desired patterns. The approaches were evaluated on two industrial cases developed by STMicroelectronics; 8051-based and a 32-bit Power Architecture SoCs. Results show that generation time was reduced upto 75% in comparison to older methodologies while increasing significantly the desired metrics. 3. Fault Injection in GPGPU: Fault injection mechanisms in semiconductor devices are suitable for generating structural patterns, testing and activating mitigation techniques, and validating robust hardware and software applications. GPGPUs are known for fast parallel computation used in high performance computing and advanced driver assistance where reliability is the key point. Moreover, GPGPU manufacturers do not provide design description code due to content secrecy. Therefore, commercial fault injectors using the GPGPU model is unfeasible, making radiation tests the only resource available, but are costly. In the last part of this thesis, we propose a software implemented fault injector able to inject bit-flip in memory elements of a real GPGPU. It exploits a software debugger tool and combines the C-CUDA grammar to wisely determine fault spots and apply bit-flip operations in program variables. The goal is to validate robust parallel algorithms by studying fault propagation or activating redundancy mechanisms they possibly embed. The effectiveness of the tool was evaluated on two robust applications: redundant parallel matrix multiplication and floating point Fast Fourier Transform

Abstracts on Radio Direction Finding (1899 - 1995)

The files on this record represent the various databases that originally composed the CD-ROM issue of "Abstracts on Radio Direction Finding" database, which is now part of the Dudley Knox Library's Abstracts and Selected Full Text Documents on Radio Direction Finding (1899 - 1995) Collection. (See Calhoun record https://calhoun.nps.edu/handle/10945/57364 for further information on this collection and the bibliography). Due to issues of technological obsolescence preventing current and future audiences from accessing the bibliography, DKL exported and converted into the three files on this record the various databases contained in the CD-ROM. The contents of these files are: 1) RDFA_CompleteBibliography_xls.zip [RDFA_CompleteBibliography.xls: Metadata for the complete bibliography, in Excel 97-2003 Workbook format; RDFA_Glossary.xls: Glossary of terms, in Excel 97-2003 Workbookformat; RDFA_Biographies.xls: Biographies of leading figures, in Excel 97-2003 Workbook format]; 2) RDFA_CompleteBibliography_csv.zip [RDFA_CompleteBibliography.TXT: Metadata for the complete bibliography, in CSV format; RDFA_Glossary.TXT: Glossary of terms, in CSV format; RDFA_Biographies.TXT: Biographies of leading figures, in CSV format]; 3) RDFA_CompleteBibliography.pdf: A human readable display of the bibliographic data, as a means of double-checking any possible deviations due to conversion