Evolution of Pb-Free Solders

This chapter discusses the evolution of lead free (Pb-free) solder, from tin-silver-copper (SAC) system with silver content of 3.0, 3.8, and 4.0 to low SAC system such as SAC0307 and SAC105 and the emerge of high reliability Pb-free solder. The discussion covers the reason and the driving force of industries implementing this change. The solder composition has evolved further recently to fulfill high reliability requirement of certain sectors such as automotive, aerospace, and military which are preparing to go green in soldering technology. This kind of high reliability solder involves additional microalloying of tin (Sn)-based solder in making it to be more robust. In this chapter, the author will introduce the techniques used by solder makers and researchers in enhancing the Pb-free solder strength in the recent evolution. Recently, attention has been drawn to low temperature joining technology again such as silver sintered joint and liquid-phase diffusion bonding material used in high power density and high junction temperature-integrated circuits. Pb-free joining material is required to replace the high Pb solder, which is still commonly used in such high-power devices

Packaging/assembling technologies for a high performance SiC-based planar power module

This work is to investigate the relevant packaging / assembling technologies for developing a SiC-based planar power module which is aimed to meet the requirements such as operating temperature of -60 °C to 200 °C, SiC devices connected to 540 V DC bus and non-hermetic module. The results reported in this paper include: (i) design of a compact wire-less SiC-based power module with low parasitic inductance; (ii) demonstrated feasibility and reliability for the sintering of Ag nanoparticles and flexible printed circuit board as alternative joining and interconnect technologies which have been selected to assemble the designed power module; and (iii) preliminary construction of the designed module and electrical switching test of the constructed module

Bonding strength of multiple SiC die attachment prepared by sintering of Ag nanoparticles

3 mm × 3 mm dummy SiC dies with 100\200\200 nm thick Ti\W\Au metallization have simultaneously been attached using sintering of Ag nanoparticle paste on AlN-based direct bonded copper substrates with 5\0.1 μm thick NiP\Au finish. The effect of preparation and sintering parameters including time of drying the printed paste, sintering temperature and time, and pressure, on the average shear strength for multiple die attachments was investigated. The surfaces of the die attachments after the shear tests were observed and the individual shear strength values correlated with the “apparent” porosity and thicknesses of the corresponding die attachments (sintered layer). The results obtained are further discussed and compared with typical data reported in existing literature. Main conclusions include: (i) the present shear strength values and their variations are comparable with those reported for single die attachment samples, (ii) the effects of sintering parameters can be ascribed to the effectiveness of the organic content burnout and appropriate rate of growth and coalescence of the Ag nanoparticles during the sintering process, and (iii) thickness values of the sintered Ag die attachments may be taken as non-destructive measurements to monitor/evaluate the quality of die attachment during power electronic module manufacturing/assembly process

過度液相焼結法によるパワーモジュールと銅ヒートスプレッダの低温及び低圧力接合

早大学位記番号:新7685早稲田大

Identification of damage and fracture modes in power electronic packaging from experimental micro-shear tests and finite element modeling

Micro-shear tests are performed in order to characterize the mechanical behavior and the fracture of the chip/metallized ceramic substrate assemblies of power electronic devices. These assemblies are elaborated using three types of junctions: AuGe solder/Au or Ag finish, transient liquid phase bonding (TLPB) AgIn/Ag finish and Ag nanoparticles/Au or Ag finish. The experiments are associated to finite element simulations of both nano-indentation and micro-shear tests. The mechanical behavior of the different assembly interfaces is represented using an in-built cohesive zone model (CZM) available in the user friendly finite element code Abaqus. It is worth noting that the fracture mechanisms observed during the test and service periods of the power electronic packaging are not only due to the debonding at the interfaces but also to the initiation and growth of voids in the joint. Therefore, in addition to the CZM model, Gurson-Tvergaard-Needlmann (GTN) damage model is used in combination with the Rice bifurcation theory to correctly describe the fracture in the joint and, therefore the overall fracture mechanism of the entire junction. The simulation results are compared with the experimental force displacement curves and the SEM observations in order to assess the implemented model