44,236 research outputs found
Test exploration and validation using transaction level models
The complexity of the test infrastructure and test strategies in systems-on-chip approaches the complexity of the functional design space. This paper presents test design space exploration and validation of test strategies and schedules using transaction level models (TLMs). Since many aspects of testing involve the transfer of a significant amount of test stimuli and responses, the communication-centric view of TLMs suits this purpose exceptionally wel
DFT and BIST of a multichip module for high-energy physics experiments
Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments conducted on the Large Hadron Collider. An array of these MCMs handles multichannel data acquisition and signal processing. Testing the MCM from board to die level required a combination of DFT strategie
On applying the set covering model to reseeding
The Functional BIST approach is a rather new BIST technique based on exploiting embedded system functionality to generate deterministic test patterns during BIST. The approach takes advantages of two well-known testing techniques, the arithmetic BIST approach and the reseeding method. The main contribution of the present paper consists in formulating the problem of an optimal reseeding computation as an instance of the set covering problem. The proposed approach guarantees high flexibility, is applicable to different functional modules, and, in general, provides a more efficient test set encoding then previous techniques. In addition, the approach shorts the computation time and allows to better exploiting the tradeoff between area overhead and global test length as well as to deal with larger circuits
Thermoelectric generators for deep space application
Suitability of radioisotope thermoelectric generators for unmanned deep space probe
LOT: Logic Optimization with Testability - new transformations for logic synthesis
A new approach to optimize multilevel logic circuits is introduced. Given a multilevel circuit, the synthesis method optimizes its area while simultaneously enhancing its random pattern testability. The method is based on structural transformations at the gate level. New transformations involving EX-OR gates as well as Reed–Muller expansions have been introduced in the synthesis of multilevel circuits. This method is augmented with transformations that specifically enhance random-pattern testability while reducing the area. Testability enhancement is an integral part of our synthesis methodology. Experimental results show that the proposed methodology not only can achieve lower area than other similar tools, but that it achieves better testability compared to available testability enhancement tools such as tstfx. Specifically for ISCAS-85 benchmark circuits, it was observed that EX-OR gate-based transformations successfully contributed toward generating smaller circuits compared to other state-of-the-art logic optimization tools
A Survey of Cellular Automata: Types, Dynamics, Non-uniformity and Applications
Cellular automata (CAs) are dynamical systems which exhibit complex global
behavior from simple local interaction and computation. Since the inception of
cellular automaton (CA) by von Neumann in 1950s, it has attracted the attention
of several researchers over various backgrounds and fields for modelling
different physical, natural as well as real-life phenomena. Classically, CAs
are uniform. However, non-uniformity has also been introduced in update
pattern, lattice structure, neighborhood dependency and local rule. In this
survey, we tour to the various types of CAs introduced till date, the different
characterization tools, the global behaviors of CAs, like universality,
reversibility, dynamics etc. Special attention is given to non-uniformity in
CAs and especially to non-uniform elementary CAs, which have been very useful
in solving several real-life problems.Comment: 43 pages; Under review in Natural Computin
Index to NASA Tech Briefs, 1975
This index contains abstracts and four indexes--subject, personal author, originating Center, and Tech Brief number--for 1975 Tech Briefs
Method for Testing Field Programmable Gate Arrays
A method of testing field programmable gate arrays (FPGAs) includes the step of configuring programmable logic blocks of the FPGAs for completing a built-in self-test. This is followed by the steps of initiating the built-in self-test, generating test patterns with the programmable logic blocks and analyzing a resulting response to produce a pass/fail indication with the programmable logic blocks. More specifically, the configuring step includes establishing a first group of programmable logic blocks as test pattern generators and output response analyzers and a second group of programmable logic blocks as blocks under test. The blocks under test are then repeatedly recongifured in order to completely test each block under test in all possible modes of operation. The programming of the first and second groups of programmable logic blocks is then reversed and the testing of each new block under test is then completed
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